Cantilever calibration for nanofriction experiments with atomic force microscope
- Laboratoire d'Analyse des Interfaces et de Nanophysique, Unite Mixte de Recherche 5011, Universite Montpellier 2, Case Courrier 082, Place E. Bataillon, 34095 Montpellier Cedex (France)
The lateral force microscope can provide information on frictional properties on surfaces down to the nanometer scale. Reproducible quantitative measurements require an accurate calibration of the mechanical response of cantilever. In this letter, we propose a fast and nondestructive method to determine the normal and lateral cantilever stiffness, k{sub cantilever}{sup N} and k{sub cantilever}{sup L}, used to calculate the normal and friction forces.
- OSTI ID:
- 20702371
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 16 Vol. 86; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Lateral force microscope calibration using a modified atomic force microscope cantilever
Calibration of atomic force microscope cantilevers using piezolevers
Friction effects in the deflection of atomic force microscope cantilevers
Journal Article
·
Mon Oct 15 00:00:00 EDT 2007
· Review of Scientific Instruments
·
OSTI ID:21024453
Calibration of atomic force microscope cantilevers using piezolevers
Journal Article
·
Sun Apr 15 00:00:00 EDT 2007
· Review of Scientific Instruments
·
OSTI ID:20953426
Friction effects in the deflection of atomic force microscope cantilevers
Journal Article
·
Mon Jan 31 23:00:00 EST 1994
· Review of Scientific Instruments; (United States)
·
OSTI ID:5338903