Depth Profile of Uncompensated Spins in an Exchange Bias System

Journal Article · Fri Jul 22 04:00:00 EDT 2005 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.95.047201· OSTI ID:20696482

Roy, S; Dorn, M; Roshchin, Igor V; Zhipan, Li; Schuller, Ivan K ^[1]; Fitzsimmons, M R; Park, S; Misra, A; Zhang, X ^[2]; Petracic, O ^[1]; Batlle, X ^[1]; Morales, R ^[1]; Chesnel, K; Kortright, J B ^[3]; Sinha, S K ^[1]

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1. Department of Physics, University of California at San Diego, La Jolla, California 92093 (United States)
2. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
3. Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

We have used the unique spatial sensitivity of polarized neutron and soft x-ray beams in reflection geometry to measure the depth dependence of magnetization across the interface between a ferromagnet and an antiferromagnet. The net uncompensated magnetization near the interface responds to applied field, while uncompensated spins in the antiferromagnet bulk are pinned, thus providing a means to establish exchange bias.

• OSTI ID: 20696482
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 4 Vol. 95; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANTIFERROMAGNETIC MATERIALS
COBALT
ELECTRONS
EXCHANGE INTERACTIONS
FERROMAGNETIC MATERIALS
GEOMETRY
INTERFACES
IRON COMPOUNDS
MAGNETISM
MAGNETIZATION
NEUTRON BEAMS
NEUTRON DIFFRACTION
REFLECTION
SOFT X RADIATION
SPIN
THIN FILMS
X-RAY DIFFRACTION