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Title: Ion beam nitriding of single and polycrystalline austenitic stainless steel

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1863455· OSTI ID:20668310
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  1. Laboratoire de Metallurgie Physique, SP2MI, Universite de Poitiers, Boulevard P. et M. Curie, Teleport 2, BP 30179, 86962 Futuroscope Chasseneuil Cedex, France and Department of Physics, Faculty of Natural Sciences, Vytautas Magnus University, 58 Donelaicio st., LT-3000 Kaunas (Lithuania)

Polycrystalline and single crystalline [orientations (001) and (011)] AISI 316L austenitic stainless steel was implanted at 400 deg. C with 1.2 keV nitrogen ions using a high current density of 0.5 mA cm{sup -2}. The nitrogen distribution profiles were determined using nuclear reaction analysis (NRA). The structure of nitrided polycrystalline stainless steel samples was analyzed using glancing incidence and symmetric x-ray diffraction (XRD) while the structure of the nitrided single crystalline stainless steel samples was analyzed using x-ray diffraction mapping of the reciprocal space. For identical treatment conditions, it is observed that the nitrogen penetration depth is larger for the polycrystalline samples than for the single crystalline ones. The nitrogen penetration depth depends on the orientation, the <001> being more preferential for nitrogen diffusion than <011>. In both type of samples, XRD analysis shows the presence of the phase usually called 'expanded' austenite or {gamma}{sub N} phase. The lattice expansion depends on the crystallographic plane family, the (001) planes showing an anomalously large expansion. The reciprocal lattice maps of the nitrided single crystalline stainless steel demonstrate that during nitriding lattice rotation takes place simultaneously with lattice expansion. The analysis of the results based on the presence of stacking faults, residual compressive stress induced by the lattice expansion, and nitrogen concentration gradient indicates that the average lattice parameter increases with the nitrided layer depth. A possible explanation of the anomalous expansion of the (001) planes is presented, which is based on the combination of faster nitriding rate in the (001) oriented grains and the role of stacking faults and compressive stress.

OSTI ID:
20668310
Journal Information:
Journal of Applied Physics, Vol. 97, Issue 8; Other Information: DOI: 10.1063/1.1863455; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English