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Title: Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO{sub 3} on SrTiO{sub 3}

Abstract

High-quality epitaxial thin films of EuTiO{sub 3} have been grown on the (001) surface of SrTiO{sub 3} using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail by using ex situ x-ray diffraction. The thickness and composition were confirmed with Rutherford backscattering spectroscopy. The EuTiO{sub 3} thin films grow two dimensionally, epitaxially, and pseudomorphically, with no measurable in-plane lattice mismatch.

Authors:
; ; ; ;  [1]
  1. School of Applied and Engineering Physics and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853 (United States)
Publication Date:
OSTI Identifier:
20662159
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 96; Journal Issue: 9; Other Information: DOI: 10.1063/1.1794362; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CRYSTAL GROWTH; ENERGY BEAM DEPOSITION; EPITAXY; EUROPIUM COMPOUNDS; LASER RADIATION; LAYERS; PULSED IRRADIATION; REFLECTION; REFLECTIVITY; ROUGHNESS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRAINS; STRESSES; STRONTIUM TITANATES; SURFACES; THICKNESS; THIN FILMS; TWO-DIMENSIONAL CALCULATIONS; X-RAY DIFFRACTION

Citation Formats

Wang, H -H, Fleet, Aaron, Brock, J D, Dale, Darren, Suzuki, Yuri, and Department of Materials Science and Engineering and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853. Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO{sub 3} on SrTiO{sub 3}. United States: N. p., 2004. Web. doi:10.1063/1.1794362.
Wang, H -H, Fleet, Aaron, Brock, J D, Dale, Darren, Suzuki, Yuri, & Department of Materials Science and Engineering and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853. Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO{sub 3} on SrTiO{sub 3}. United States. doi:10.1063/1.1794362.
Wang, H -H, Fleet, Aaron, Brock, J D, Dale, Darren, Suzuki, Yuri, and Department of Materials Science and Engineering and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853. Mon . "Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO{sub 3} on SrTiO{sub 3}". United States. doi:10.1063/1.1794362.
@article{osti_20662159,
title = {Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO{sub 3} on SrTiO{sub 3}},
author = {Wang, H -H and Fleet, Aaron and Brock, J D and Dale, Darren and Suzuki, Yuri and Department of Materials Science and Engineering and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853},
abstractNote = {High-quality epitaxial thin films of EuTiO{sub 3} have been grown on the (001) surface of SrTiO{sub 3} using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail by using ex situ x-ray diffraction. The thickness and composition were confirmed with Rutherford backscattering spectroscopy. The EuTiO{sub 3} thin films grow two dimensionally, epitaxially, and pseudomorphically, with no measurable in-plane lattice mismatch.},
doi = {10.1063/1.1794362},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 9,
volume = 96,
place = {United States},
year = {2004},
month = {11}
}