Enhanced dielectric properties of Ba{sub 1-x}Sr{sub x}TiO{sub 3} thin film grown on La{sub 1-x}Sr{sub x}MnO{sub 3} bottom layer
Journal Article
·
· Journal of Applied Physics
- National Laboratory for Superconductivity, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080 (China)
The Ba{sub 0.7}Sr{sub 0.3}TiO{sub 3} (BST)/La{sub 0.67}Sr{sub 0.33}MnO{sub 3} (LSMO) heterostructure has been fabricated by pulsed-laser deposition on (001) SrTiO{sub 3} single crystal substrate. The crystallization and surface morphology of the heterostructure have been characterized by x-ray diffraction and atomic force microscopy. The composition distribution along the depth of the heterostructure is analyzed by Auger electron spectroscopy. It is founded that the LSMO bottom layer shows a marked effect on the dielectric properties of the BST films. Comparing with BST/YBCO (YBCO-YBa{sub 2}Cu{sub 3}O{sub 7}) heterostructure grown by similar process, the dielectric loss exhibits much lower and less frequency dispersive, especially in the high frequency region. The loss tangent at 100 kHz is about 0.012 and the figure of merit factor is about 25 under the condition of 200 kV/cm. Ferroelectric hysteresis measurement shows that the remanent polarization and coercive field of the heterostructure are 3.4 {mu}C/cm{sup 2} and 39 kV/cm, respectively. These parameters are all better than BST/YBCO heterostructure. The good surface morphology and the element diffusion between BST and LSMO layers may be suggested to be responsible for the above-improved parameters of BST/LSMO heterostructure.
- OSTI ID:
- 20658106
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 96; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
AUGER ELECTRON SPECTROSCOPY
BARIUM COMPOUNDS
CRYSTALLIZATION
CUPRATES
CURRENT DENSITY
DIELECTRIC MATERIALS
ENERGY BEAM DEPOSITION
HIGH-TC SUPERCONDUCTORS
LANTHANUM COMPOUNDS
LASER RADIATION
LEAKAGE CURRENT
MANGANESE OXIDES
PERMITTIVITY
POLARIZATION
PULSED IRRADIATION
STRONTIUM TITANATES
THIN FILMS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
ATOMIC FORCE MICROSCOPY
AUGER ELECTRON SPECTROSCOPY
BARIUM COMPOUNDS
CRYSTALLIZATION
CUPRATES
CURRENT DENSITY
DIELECTRIC MATERIALS
ENERGY BEAM DEPOSITION
HIGH-TC SUPERCONDUCTORS
LANTHANUM COMPOUNDS
LASER RADIATION
LEAKAGE CURRENT
MANGANESE OXIDES
PERMITTIVITY
POLARIZATION
PULSED IRRADIATION
STRONTIUM TITANATES
THIN FILMS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS