Microsecond Time-resolved Diffraction and Scattering Measurements System Using Semi-monochromatic X-ray Pulse at SPring-8 BL40XU
- Life and Environmental Science Division, SPring-8/JASRI, Mikazuki, Sayo, Hyogo, 679-5198 (Japan)
SPring-8 BL40XU is designed to use high flux X-ray. On this basic concept, the fundamental radiation of the helical undulator is used as a semi-monochromatic X-ray beam. The flux at the experimental hutch is 1.0x1015 sec-1 at 12.4 KeV and the energy of X-ray width is about 1.8 %. Using the high flux X-ray, we constructed a microsecond time-resolved X-ray diffraction or scattering measurement system. This system is mainly for biological SAXS measurements, but small arrangements can make wide-angle measurements possible. In the system, an X-ray pulse of time width up to 6 {mu}s is used to measure a transient state of a sample. Measurement sequence is as follows; a sample reaction is started (by exposing laser light etc.), and then a pulsed X-ray is exposed on the sample to measure diffraction or scattering at transient state. We can obtain structural information of a sample at one point of reaction process per one measurement. It is necessary, therefore, to change the delay time, or sample conditions, to get an entire sequence data.
- OSTI ID:
- 20652839
- Journal Information:
- AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758014; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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