Application of the focusing x-ray spectrograph with crossed dispersion to investigations of X pinch plasmas

Journal Article · Fri Oct 01 00:00:00 EDT 2004 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1781375· OSTI ID:20636750

Pikuz, S A; Song, B M; Shelkovenko, T A; Chandler, K M; Mitchell, M D; Hammer, D A ^[1]

---

1. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853 (United States)

A new focusing spectrograph configuration with crossed dispersion (FSCD) has been developed for use in X pinch experiments. This device solves the problem in a crystal spectrograph of the overlapping of reflected radiation in many orders. The x-ray radiation from a small source is dispersed by a transmission grating before it reaches the Bragg reflector (mica crystal). A large aperture (10 mmx10 mm), 0.5 {mu}m period gold transmission grating was made on a 0.5 {mu}m thick Si{sub 3}N{sub 4} substrate and combined with spherically bent mica crystals with radii of curvature of 100 mm or 186 mm. Results of FSCD application to plasma experiments with X pinch x-ray sources is presented.

• OSTI ID: 20636750
• Journal Information: Review of Scientific Instruments, Vol. 75, Issue 10; Conference: 15. topical conference on high temperature plasma diagnostics, San Diego, CA (United States), 19-22 Apr 2004; Other Information: DOI: 10.1063/1.1781375; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CRYSTALS
GRATINGS
MICA
OPTICAL DISPERSION
PINCH EFFECT
PLASMA DIAGNOSTICS
SILICON NITRIDES
X-RAY DETECTION
X-RAY SOURCES
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY