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Partial dissociative ionization of SF{sub 6} by electron impact using an ejected electron-ion coincidence technique

Journal Article · · Physical Review. A
;  [1];  [2]
  1. Atomic Physics Laboratory, Physics Department, Banaras Hindu University, Varanasi-221 005 (India)
  2. Fachbereich Physik, Universitaet Greifswald, Domstrasse 10a, 17487-Greifswald (Germany)
The relative differential partial ionization cross sections for the production of ionic fragments of SF{sub 6} molecule under impact of 10-20 keV electrons have been measured using an ejected electron-produced ion coincidence technique in a crossed beam apparatus with a time-of-flight analysis of the ions. The detection angle of the ejected electrons of nondiscriminated energies was kept at 90 deg. with respect to the incident electron-beam direction. The 14 ionic fragments: SF{sub 5}{sup +}, SF{sub 4}{sup +}, SF{sub 3}{sup +}, SF{sub 2}{sup +}, SF{sup +}, S{sup +}, F{sup +}, SF{sub 4}{sup 2+}, SF{sub 3}{sup 2+}, SF{sub 2}{sup 2+}, S{sup 2+}, F{sup 2+}, SF{sub 3}{sup 3+}, and S{sup 3+} resulting from the dissociative ionization of the SF{sub 6} molecule were identified and their relative production cross sections have been measured. The branching ratios of 8 ionic fragments SF{sub m}{sup n+} (m=1 to 5 and n=1 to 3) as a function of impact energy have been determined. These ratios are found to have an almost a constant value over the considered impact energy range within the experimental uncertainty of the measurements. For the investigated impact energies, no previous data or theoretical calculations exist for a direct comparison with the present results.
OSTI ID:
20633716
Journal Information:
Physical Review. A, Journal Name: Physical Review. A Journal Issue: 2 Vol. 67; ISSN 1050-2947; ISSN PLRAAN
Country of Publication:
United States
Language:
English

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