Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Journal Article · Thu Nov 30 23:00:00 EST 1995 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.489241· OSTI ID:203721

Adolphsen, J ^[1]; Barth, J L; Stassinopoulos, E G; Gruner, T; Wennersten, M; LaBel, K A ^[2]; Seidleck, C M ^[3]

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1. UNISYS, Lanham, MD (United States)
2. National Aeronautics and Space Administration, Greenbelt, MD (United States). Goddard Space Flight Center
3. Hughes ST Systems, Greenbelt, MD (United States)

This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. Pitfalls of using generic ground test data are made clearly evident.

• OSTI ID: 203721
• Report Number(s): CONF-950716--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 42; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ERRORS
EXPERIMENTAL DATA
PHYSICAL RADIATION EFFECTS
SATELLITES
SEMICONDUCTOR STORAGE DEVICES
SPACE FLIGHT