SEU fault tolerance in artificial neural networks
Journal Article
·
· IEEE Transactions on Nuclear Science
- Lab. de Genie Informatique, Grenoble (France)
- Centre National d`Etudes Spatiales, Toulouse (France)
- Univ. Politecnica de Catalunya, Barcelona (Spain)
In this paper the authors investigate the robustness of Artificial Neural Networks when encountering transient modification of information bits related to the network operation. These kinds of faults are likely to occur as a consequence of interaction with radiation. Results of tests performed to evaluate the fault tolerance properties of two different digital neural circuits are presented.
- OSTI ID:
- 203708
- Report Number(s):
- CONF-950716--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 42; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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