Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Journal Article · Mon Dec 27 04:00:00 EST 1999 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.125581· OSTI ID:20217763

Bar, G ^[1]; Delineau, L ^[1]; Brandsch, R ^[1]; Bruch, M ^[1]; Whangbo, M -H ^[2]

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1. Freiburger Materialforschungszentrum and Institut fuer Makromolekulare Chemie, Albert-Ludwigs Universitaet, Stefan Meier-Str. 21, 79104 Freiburg, (Germany)
2. Department of Chemistry, North Carolina State University, Raleigh, North Carolina 27695-8204 (United States)

We studied the response of a cantilever tapping on polydimethylsiloxane (PDMS) samples of different crosslink density. It is shown experimentally that the tip deeply penetrates into the compliant PDMS samples. A more compliant material leads to a larger indentation such that at a given set-point ratio the indentation force is nearly constant on samples of different elastic moduli. This confirms the simulations by J. Tamayo and R. Garcia [Appl. Phys. Lett. 71, 2394 (1997)] that phase contrast acquired at constant set point does not depend on the sample's modulus if other contrast relevant parameters remain identical. PDMS samples of different crosslink density are distinguished in terms of amplitude and phase versus distance measurements if the tip-sample interaction is made substantially large and indentation is taken into account. (c) 1999 American Institute of Physics.

• OSTI ID: 20217763
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 75; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DENSITY
ELASTICITY
ELASTOMERS
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
IMAGES
INTERMOLECULAR FORCES
POLYMERS