Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Excitonic Effects in Core-Excitation Spectra of Semiconductors

Journal Article · · Physical Review Letters
Core-electron excitation spectra are used widely for structural and chemical analysis of materials, but interpretation of the near-edge structure remains unsettled, especially for semiconductors. For the important Si L{sub 2,3} edge, there are two mutually inconsistent interpretations, in terms of effective-mass excitons and in terms of Bloch conduction-band final states. We report ab initio calculations and show that neither interpretation is valid and that the near-edge structure is in fact dominated by short-range electron-hole interactions even though the only bound excitons are effective-mass-like. (c) 2000 The American Physical Society.
OSTI ID:
20217643
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 10 Vol. 85; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English

Similar Records

Ab initio study of the valence-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the Si L sub 2,3 edge
Journal Article · Sat Dec 14 23:00:00 EST 1991 · Physical Review, B: Condensed Matter; (United States) · OSTI ID:5525050

Phonon Screening of Excitons in Atomically Thin Semiconductors
Journal Article · Tue Nov 12 19:00:00 EST 2024 · Physical Review Letters · OSTI ID:2571376

Magnetically Enhanced Exciton-Exciton Correlations in Semiconductors
Journal Article · Fri Jan 31 23:00:00 EST 1997 · Physical Review Letters · OSTI ID:467416