Epitaxial metastable Ge{sub 1-y}C{sub y} (y{<=}0.02) alloys grown on Ge(001) from hyperthermal beams: C incorporation and lattice sites
Journal Article
·
· Journal of Applied Physics
- Materials Science Department, the Coordinated Science Laboratory, and the Materials Research Laboratory, University of Illinois, 104 South Goodwin Avenue, Urbana, Illinois 61801 (United States)
- Groupe de Recherche en Physique et Technologie des Couches Minces and Departement de Genie Physique et de Genie des Materiaux, Ecole Polytechnique de Montreal, P.O. Box 6079, Station Centre-Ville, Montreal, Quebec H3C 3A7, (Canada)
- Groupe de Recherche en Physique et Technologie des Couches Minces and Departement de Physique, Universite de Montreal, P.O. Box 6128, Station Centre-Ville, Montreal, Quebec H3C 3J7, (Canada)
Epitaxial metastable Ge{sub 1-y}C{sub y} alloy layers with y{<=}0.02 were grown on Ge(001) at temperatures T{sub s}=200-550 degree sign C using hyperthermal Ge and C beams with average energies of 16 and 24 eV, respectively, in order to investigate C incorporation pathways in the Ge lattice. High-resolution reciprocal lattice maps show that all as-deposited alloy layers are fully coherent with the substrate. Layers grown at T{sub s}{<=}350 degree sign C are in compression due to higher C concentrations in interstitial than in substitutional sites. The compressive strain decreases (i.e., the substitutional C concentration increases) with increasing T{sub s} within this temperature range. At higher growth temperatures, as-deposited alloys are nearly strain free since the majority of the incorporated C is trapped at extended defects. Annealing the Ge{sub 1-y}C{sub y} layers at T{sub a}=450 and 550 degree sign C leads to a significant increase, proportional to the strain in the as-deposited films, in compressive strain. Further annealing at T{sub a}=650 degree sign C results in the formation of dislocation loops which act as sinks for interstitial and substitutional C atoms and thus relieves residual macroscopic strain. Finally, we show that the large compressive strain associated with interstitial C atoms must be accounted for in order to determine the total incorporated C fraction from diffraction analyses. (c) 2000 American Institute of Physics.
- OSTI ID:
- 20216836
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 88; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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