Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers
- Department of Physics, University of Cincinnati, Cincinnati, Ohio 4522-0011 (United States)
- Photonics Research Department, Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
Selectively oxidized vertical cavity surface emitting lasers (VCSELs) have been studied by spectrally resolved near-field scanning optical microscopy. We have obtained spatially and spectrally resolved images of both subthreshold emission and lasing emission from a selectively oxidized VCSEL operating at a wavelength of 850 nm. Below threshold, highly local high gain regions, emitting local intensity maxima within the active area, were observed; these were found to serve as lasing centers just above threshold. Above threshold, the near-field spatial modal distributions of low order transverse modes were identified by spectrally analyzing the emission; these were found to be complex and somewhat different from those measured in the far field. (c) 2000 American Institute of Physics.
- OSTI ID:
- 20215171
- Journal Information:
- Applied Physics Letters, Vol. 76, Issue 5; Other Information: PBD: 31 Jan 2000; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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