Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Kinetics of light-induced changes in p-i-n cells with protocrystalline Si:H

Conference ·
OSTI ID:20107912

Studies have been carried out on the thickness dependent transition between the amorphous and microcrystalline phases in intrinsic Si:H materials (i-layers) and its effect on p-i-n solar cell performance. P(a-SiC:H)-i(a-Si:H)-n({micro}cSi:H) cell structures were deposited with the intrinsic Si:H layer thickness and the flow ratio of hydrogen to silane, R=[H{sub 2}]/[SiH{sub 4}], guided by an evolutionary phase diagram obtained from real-time spectroscopic ellipsometry. The thickness range over which the fill factors are controlled by the bulk was established and their characteristics investigated with different protocrystalline i-layer materials (i.e., materials prepared near the amorphous to microcrystalline boundary but on the amorphous side). Insights into the properties of these materials and the effects of the transition to the microcrystalline phase were obtained from the systematic changes in the initial fill factors, their light-induced changes, and their degraded steady states for cells with i-layers of different thickness and H{sub 2} dilution.

Research Organization:
Pennsylvania State Univ., University Park, PA (US)
Sponsoring Organization:
National Renewable Energy Laboratory; Electric Power Research Institute; New Energy and Industrial Technology Development Organization
OSTI ID:
20107912
Country of Publication:
United States
Language:
English

Similar Records

Performance and stability of Si:H p[endash]i[endash]n solar cells with [ital i] layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary
Journal Article · Wed Sep 01 00:00:00 EDT 1999 · Applied Physics Letters · OSTI ID:6407144

Structural and optical properties of a-Si:H/{mu}c-Si:H:B junctions in the a-Si:H:-based n-i-p solar cell configuration
Conference · Tue Jul 01 00:00:00 EDT 1997 · OSTI ID:20085552

Self-bias voltage diagnostics for the amorphous-to-microcrystalline transition in a-Si:H under a hydrogen-plasma treatment
Journal Article · Mon Mar 15 00:00:00 EDT 2010 · Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films · OSTI ID:22053930