Electron Channeling Contrast Imaging (ECCI) for Rapid Characterization of Compound Semiconductors.
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 2005415
- Report Number(s):
- SAND2022-13834C; 710697
- Country of Publication:
- United States
- Language:
- English
Similar Records
Failure Analysis in FeCo Magnetic Alloys through Electron Channeling Contrast Imaging Defect Characterization.
Cross-sectional Electron Channeling Contrast Imaging
Z-contrast imaging and electron channeling analysis of dopants in semiconductors
Conference
·
Thu Jul 01 00:00:00 EDT 2021
·
OSTI ID:1888124
Cross-sectional Electron Channeling Contrast Imaging
Conference
·
Thu Feb 29 23:00:00 EST 2024
·
OSTI ID:2540349
Z-contrast imaging and electron channeling analysis of dopants in semiconductors
Conference
·
Thu Feb 28 23:00:00 EST 1985
·
OSTI ID:5848413