Density Dependence of the Excitation Gap in Si/SiGe Bilayers [Slides]
- Univ. of Florida, Gainesville, FL (United States)
- National Taiwan Univ., Taipei (Taiwan)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA); National Science Foundation (NSF)
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 2001982
- Report Number(s):
- SAND2022--2791C; 704040
- Country of Publication:
- United States
- Language:
- English
Similar Records
Density Dependence of the Excitation Gap in Si/SiGe Bilayers.
Exciton condensation and valley splitting in Si/SiGe bilayers.
On-chip Multiplexing of Si/SiGe Quantum Devices.
Conference
·
Sun Feb 28 23:00:00 EST 2021
·
OSTI ID:1854315
Exciton condensation and valley splitting in Si/SiGe bilayers.
Conference
·
Mon Aug 01 00:00:00 EDT 2022
·
OSTI ID:2004437
On-chip Multiplexing of Si/SiGe Quantum Devices.
Conference
·
Sun Jan 31 23:00:00 EST 2021
·
OSTI ID:1847453