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Exploring new active regions for type 1 InAsSb strained-layer lasers

Journal Article · · Journal of Electronic Materials
The authors report on the metal-organic chemical vapor deposition (MOCVD) of mid-infrared InAsSb/InPSb optically pumped lasers grown using a high speed rotating disk reactor (RDR). The devices contain AlAsSb cladding layers and strained, type 1 InAsSb/InPSb active regions. By changing the layer thickness and composition of InAsSb/InPSb SLSs, they have prepared structures with low temperature (< 20 K) photoluminescence wavelengths ranging from 3.4 {micro}m to 4.8 {micro}m. They find a variation of bandgap from 0.272 to 0.324 eV for layer thicknesses of 9.0 to 18.2 nm. From these data they have estimated a valence band offset for the InAsSb/InPSb interface of about 400 meV. An InAsSb/InPSb SLS, optically pumped laser structure was grown on an InAs substrate with AlAs{sub 0.16}Sb{sub 0.84} cladding layers. A lasing threshold and spectrally narrowed laser emission were seen from 80 K through 240 K, the maximum temperature where lasing occurred. The temperature dependence of the SLS laser threshold is described by a characteristic temperature, T{sub 0} = 72 K, from 80 K to 200 K.
Research Organization:
Sandia National Labs., Albuquerque, NM (US)
Sponsoring Organization:
US Department of Energy
DOE Contract Number:
AC04-94AL85000
OSTI ID:
20015391
Journal Information:
Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 1 Vol. 29; ISSN JECMA5; ISSN 0361-5235
Country of Publication:
United States
Language:
English