On the figure of merit model for SEU rate calculations

Journal Article · Wed Dec 01 04:00:00 EST 1999 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers)

DOI:https://doi.org/10.1109/23.819114· OSTI ID:20014704

Barak, J; Reed, R A; LaBel, K A

Petersen has introduced a one parameter characterization of a device by the Figure of Merit (FOM). It was claimed that this parameter was sufficient to estimate the SEU rate in almost all orbits. The present paper presents an analytic study of the FOM concept and compares the FOM model with other empirical models. It is found that indeed the FOM parameter gives, in most cases, a good agreement with the rates found using the full SEU cross section plots of the devices. The agreement is poorer in cases where a high portion of the proton flux comes from low energy protons and for very SEU-hard devices. This is demonstrated for certain devices (FPGAs) where the FOM predicted by proton may be smaller by an order of magnitude than the FOM from heavy ions.

• Research Organization: National Aeronautics and Space Administration, Goddard Space Flight Center, Greenbelt, MD (US)
• OSTI ID: 20014704
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers) Journal Issue: 6Pt1 Vol. 46; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
COMPARATIVE EVALUATIONS
ELECTRONIC EQUIPMENT
FAILURES
HEAVY IONS
MATHEMATICAL MODELS
PHYSICAL RADIATION EFFECTS
PROTONS