Single event upset characterization of the Pentium{reg{underscore}sign} MMX and Pentium {reg{underscore}sign} II microprocessors using proton irradiation
Journal Article
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers)
Experimental single event upset characterization of the Pentium{reg{underscore}sign} MMX and Pentium{reg{underscore}sign}II microprocessors using proton irradiation are presented. Results show the Pentium II processor core cross-section is ten times that of the MMX.
- Research Organization:
- MacDonald Dettwiler, Space and Advanced Robotics Ltd., Brampton, Ontario (CA)
- OSTI ID:
- 20014699
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers) Journal Issue: 6Pt1 Vol. 46; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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