Interaction of extended dislocations with nanovoid clusters

Roach, Ashley M.; Xu, Shuozhi; Luscher, Darby Jon; Gianola, Daniel S.; Beyerlein, Irene Jane

doi:10.1016/j.ijplas.2023.103684

Interaction of extended dislocations with nanovoid clusters

Journal Article · Sat Jul 01 00:00:00 EDT 2023 · International Journal of Plasticity

DOI:https://doi.org/10.1016/j.ijplas.2023.103684· OSTI ID:1989166

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University of California, Santa Barbara, CA (United States)
University of Oklahoma, Norman, OK (United States)
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Voids of nanoscale dimensions in irradiated metals can act as obstacles to dislocation motion and cause strengthening. In this work, nanovoid strengthening and the influences of void size, void spacing and material properties, such as stacking fault energies, on dislocation bypass mechanisms are investigated using Phase Field Dislocation Dynamics, a three-dimensional mesoscale model that predicts the minimum energy pathway taken by discrete dislocations. A broad range of face centered cubic metals (copper, nickel, silver, rhodium, and platinum) and nanovoid sizes and spacings are treated, altogether spanning void size–to–dislocation stacking fault width ratios from less than unity to ten. Material γ-surfaces, calculated from ab initio methods, are input directly into the formulation. The analysis reveals that the critical bypass stress scales linearly with the linear void fraction, effective isotropic shear modulus, and ratio of the intrinsic to unstable stacking fault energies. With only a few exceptions, the critical stress is controlled by the stress required for the leading partial to impinge the voids (to move within range of the attractive image stress field of the void). When the void diameter is nearly an order of magnitude greater than the stacking fault width, the mechanism determining critical strength shifts to the stress for the dislocation to breakaway after partially cutting the void. Furthermore, this situation corresponds to that treated by line tension models and is realized here for Pt, with a sub-nanometer stacking fault width.

View Accepted Manuscript (DOE)

Research Organization:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP); National Science Foundation (NSF)

Grant/Contract Number:: 89233218CNA000001; NA0003960

OSTI ID:: 1989166

Report Number(s):: LA-UR--23-22714

Journal Information:: International Journal of Plasticity, Journal Name: International Journal of Plasticity Vol. 168; ISSN 0749-6419

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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