Thin film combinatorial sputtering of Al-Ce alloys: Investigating the phase separation of as-deposited solid solutions and determining the coefficient of thermal expansion

Emery, Reece; Rios, Orlando R.; Thompson, Michael J.; Weiss, David; Rack, Philip D.

doi:10.1016/j.jallcom.2022.165271

Thin film combinatorial sputtering of Al-Ce alloys: Investigating the phase separation of as-deposited solid solutions and determining the coefficient of thermal expansion

Journal Article · Tue May 03 00:00:00 EDT 2022 · Journal of Alloys and Compounds

DOI:https://doi.org/10.1016/j.jallcom.2022.165271· OSTI ID:1981649

Emery, Reece ^[1]; Rios, Orlando R. ^[1]; Thompson, Michael J. ^[1]; Weiss, David ^[2]; Rack, Philip D. ^[1]

Univ. of Tennessee, Knoxville, TN (United States)
Eck Industries, Manitowoc, WI (United States)

Al_xCe_100–x thin films with a composition range of ~75.0 < x < 99.5 at% (36.5 < x < 97.5 wt%) were synthesized via combinatorial co-sputtering from an Al and an Al₅₀Ce₅₀ target. The crystal structure, phase fraction, film morphology, electrical resistivity, and temperature-dependent coefficients of thermal expansion (CTE) are all correlated to the Al_xCe_100–x composition. The as-deposited films form a metastable solid-solution, and annealing leads to the formation of the thermodynamically stable two-phase system of Al and the α-Al₁₁Ce₃ intermetallic. Temperature dependent x-ray diffraction (XRD) reveals that the two phases expand independently of one another, and the thin film Al temperature-dependent CTE is similar to bulk Al. The thin film Al₁₁Ce₃ intermetallic phase has a nearly constant CTE of ~1.5 × 10^–5/°C within the temperature range studied (25–550 °C). To confirm the thin film Al₁₁Ce₃ results, bulk stoichiometric Al₁₁Ce₃ and +/- 1 wt% Ce samples were prepared and the CTE of each was measured with the same conditions. A Rietveld analysis of the bulk data enabled an estimation of the CTE in each of the 3 orthorhombic lattice parameters, which displayed anisotropic behavior. The thin film and bulk CTE measurements were in very good agreement. Estimations of the temperature dependent CTE of the two-phase alloys are made via the Reuss and Voigt models. Finally, by demonstrating the efficacy of the approach, more complex multi-component rapid materials discovery of low CTE Al-alloys can be pursued via the combinatorial thin film synthesis and XRD measurement.

View Accepted Manuscript (DOE)

Research Organization:: Ames Laboratory (AMES), Ames, IA (United States). Critical Materials Institute (CMI)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

Grant/Contract Number:: AC02-07CH11358

OSTI ID:: 1981649

Journal Information:: Journal of Alloys and Compounds, Journal Name: Journal of Alloys and Compounds Journal Issue: C Vol. 913; ISSN 0925-8388

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
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Metallurgy & Metallurgical engineering
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Thin films
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Thin film combinatorial sputtering of Al-Ce alloys: Investigating the phase separation of as-deposited solid solutions and determining the coefficient of thermal expansion

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