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Molecular beam homoepitaxy of N-polar AlN: Enabling role of aluminum-assisted surface cleaning

Journal Article · · Science Advances
 [1];  [2];  [2];  [2];  [3];  [3];  [4];  [5];  [5];  [3]
  1. Cornell Univ., Ithaca, NY (United States); Cornell University
  2. Osaka Univ. (Japan)
  3. Cornell Univ., Ithaca, NY (United States)
  4. Mie University (Japan)
  5. Cornell Univ., Ithaca, NY (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY (United States)

N-polar aluminum nitride (AlN) is an important building block for next-generation high-power radio frequency electronics. We report successful homoepitaxial growth of N-polar AlN by molecular beam epitaxy (MBE) on large-area, cost-effective N-polar AlN templates. Direct growth without any in situ surface cleaning leads to films with inverted Al polarity. It is found that Al-assisted cleaning before growth enables the epitaxial film to maintain N-polarity. The grown N-polar AlN epilayer with its smooth, pit-free surface duplicates the structural quality of the substrate, as evidenced by a clean and smooth growth interface with no noticeable extended defects generation. Near band-edge photoluminescence peaks are observed at room temperature on samples with MBE-grown layers but not on the bare AlN templates, implying the suppression of nonradiative recombination centers in the epitaxial N-polar AlN.

Research Organization:
Arizona State Univ., Tempe, AZ (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); US Air Force Office of Scientific Research (AFOSR); National Science Foundation (NSF)
Grant/Contract Number:
SC0021230
OSTI ID:
1980720
Journal Information:
Science Advances, Journal Name: Science Advances Journal Issue: 36 Vol. 8; ISSN 2375-2548
Publisher:
AAASCopyright Statement
Country of Publication:
United States
Language:
English

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