Direct observation of the structure of nickel oxide electrochromic thin films by HRTEM

Book · Sun Dec 31 00:00:00 EST 1995

OSTI ID:197611

Yoshimura, Kazuki; Miki, Takeshi; Tanemura, Sakae ^[1]

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1. National Industrial Research Inst. of Nagoya (Japan). Multifunctional Material Science Dept.

To investigate the microstructure of nickel oxide electrochromic films, cross-sectional observation of sputtered nickel oxide film was performed using a high resolution electron microscope. Lattice and atomic image could be observed for as-deposited sample and bleached sample. These images showed that crystallized NiO exists in both samples. As-deposited film contained small amount of Ni{sub 2}O{sub 3}. One of [111] axis shrank about 3% and the lattice was a little bit strained in bleached state. The fact that no trace of Ni(OH){sub 2} or other species was observed implies that the boundary and surface of NiO microcrystallites played an important role in the electrochromic reaction.

• OSTI ID: 197611
• Report Number(s): CONF-950793-; ISBN 0-8194-1890-0; TRN: IM9612%%385
• Resource Relation: Conference: 40. annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 9-14 Jul 1995; Other Information: PBD: 1995; Related Information: Is Part Of Optical materials technology for energy efficiency and solar energy conversion XIV; Lampert, C.M. [ed.] [Lawrence Berkeley Lab., CA (United States). Energy and Environment Div.]; Deb, S.K. [ed.] [National Renewable Energy Lab., Golden, CO (United States)]; Grandqvist, C.G. [ed.] [Uppsala Univ. (Sweden). Dept. of Technology]; PB: 379 p.; Proceedings/SPIE, Volume 2531
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION
NICKEL OXIDES
MICROSTRUCTURE
ELECTROCHROMISM
WINDOWS
GLAZING
NICKEL HYDROXIDES
X-RAY DIFFRACTION
EXPERIMENTAL DATA
SOLAR CONTROL FILMS