Direct observation of the structure of nickel oxide electrochromic thin films by HRTEM
Book
·
OSTI ID:197611
- National Industrial Research Inst. of Nagoya (Japan). Multifunctional Material Science Dept.
To investigate the microstructure of nickel oxide electrochromic films, cross-sectional observation of sputtered nickel oxide film was performed using a high resolution electron microscope. Lattice and atomic image could be observed for as-deposited sample and bleached sample. These images showed that crystallized NiO exists in both samples. As-deposited film contained small amount of Ni{sub 2}O{sub 3}. One of [111] axis shrank about 3% and the lattice was a little bit strained in bleached state. The fact that no trace of Ni(OH){sub 2} or other species was observed implies that the boundary and surface of NiO microcrystallites played an important role in the electrochromic reaction.
- OSTI ID:
- 197611
- Report Number(s):
- CONF-950793--; ISBN 0-8194-1890-0
- Country of Publication:
- United States
- Language:
- English
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