Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines

Reisbick, Spencer A.; Pofelski, Alexandre; Han, Myung-Geun; Liu, Chuhang; Montgomery, Eric; Jing, Chunguang; Sawada, Hidetaka; Zhu, Yimei

doi:10.1016/j.ultramic.2023.113733

Title: Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines

Journal Article · Wed Apr 05 00:00:00 EDT 2023 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2023.113733· OSTI ID:1970023

^[1]; Pofelski, Alexandre ^[1]; Han, Myung-Geun ^[1]; Liu, Chuhang ^[2]; Montgomery, Eric ^[3]; Jing, Chunguang ^[3]; Sawada, Hidetaka ^[4]; Zhu, Yimei ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States); Stony Brook Univ., NY (United States)
Euclid Techlabs, LLC, Bolingbrook, IL (United States)
JEOL USA LTD, Peabody, MA (United States)

Advancements in ultrafast electron microscopy have allowed elucidation of spatially selective structural dynamics. However, as the spatial resolution and imaging capabilities have made progress, quantitative characterization of the electron pulse trains has not been reported at the same rate. In fact, inexperienced users have difficulty replicating the technique because only a few dedicated microscopes have been characterized thoroughly. Systems replacing laser driven photoexcitation with electrically driven deflectors especially suffer from a lack of quantified characterization because of the limited quantity. The primary advantages to electrically driven systems are broader frequency ranges, ease of use and simple synchronization to electrical pumping. Here, we characterize the technical parameters for electrically driven UEM including the shape, size and duration of the electron pulses using low and high frequency chopping methods. At high frequencies, pulses are generated by sweeping the electron beam across a chopping aperture. For low frequencies, the beam is continuously forced off the optic axis by a DC potential, then momentarily aligned by a countering pulse. Using both methods, we present examples that measure probe durations of 2 ns and 10 ps for the low and high frequency techniques, respectively. Here, we also discuss how the implementation of a pulsed probe affects STEM imaging conditions by adjusting the first condenser lens.

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Research Organization:: Euclid Techlabs, LLC, Bolingbrook, IL (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0013121; SC0012704; DESC0012704

OSTI ID:: 1970023

Alternate ID(s):: OSTI ID: 1968925; OSTI ID: 1975240

Report Number(s):: BNL-224451-2023-JAAM; TRN: US2313476

Journal Information:: Ultramicroscopy, Vol. 249; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

References (41)

Laser beam shaping profiles and propagation Shealy, David L.; Hoffnagle, John A. Applied Optics, Vol. 45, Issue 21 https://doi.org/10.1364/AO.45.005118	journal	January 2006
Nanoscale Mechanical Drumming Visualized by 4D Electron Microscopy Kwon, Oh-Hoon; Barwick, Brett; Park, Hyun Soon Nano Letters, Vol. 8, Issue 11 https://doi.org/10.1021/nl8029866	journal	November 2008
Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy Zandi, Omid; Sykes, Allan E.; Cornelius, Ryan D. Nature Communications, Vol. 11, Issue 1 https://doi.org/10.1038/s41467-020-16746-z	journal	June 2020
Ultrafast transmission electron microscopy using a laser-driven field emitter: Femtosecond resolution with a high coherence electron beam Feist, Armin; Bach, Nora; Rubiano da Silva, Nara Ultramicroscopy, Vol. 176 https://doi.org/10.1016/j.ultramic.2016.12.005	journal	May 2017
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope Reisbick, Spencer A.; Han, Myung-Geun; Liu, Chuhang Ultramicroscopy, Vol. 235 https://doi.org/10.1016/j.ultramic.2022.113497	journal	May 2022
Observation of Anisotropic Strain-Wave Dynamics and Few-Layer Dephasing in MoS ₂ with Ultrafast Electron Microscopy Zhang, Yichao; Flannigan, David J. Nano Letters, Vol. 19, Issue 11 https://doi.org/10.1021/acs.nanolett.9b03596	journal	September 2019
Characterization of fast photoelectron packets in weak and strong laser fields in ultrafast electron microscopy Plemmons, Dayne A.; Tae Park, Sang; Zewail, Ahmed H. Ultramicroscopy, Vol. 146 https://doi.org/10.1016/j.ultramic.2014.08.001	journal	November 2014
Kikuchi ultrafast nanodiffraction in four-dimensional electron microscopy Yurtsever, A.; Zewail, A. H. Proceedings of the National Academy of Sciences, Vol. 108, Issue 8 https://doi.org/10.1073/pnas.1018733108	journal	January 2011
Ultrafast transient absorption spectroscopy: principles and application to photosynthetic systems Berera, Rudi; van Grondelle, Rienk; Kennis, John T. M. Photosynthesis Research, Vol. 101, Issue 2-3 https://doi.org/10.1007/s11120-009-9454-y	journal	July 2009
Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets VandenBussche, Elisah J.; Flannigan, David J. Nano Letters, Vol. 19, Issue 9 https://doi.org/10.1021/acs.nanolett.9b03074	journal	August 2019
GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method Qiu, Jiaqi; Ha, Gwanghui; Jing, Chunguang Ultramicroscopy, Vol. 161 https://doi.org/10.1016/j.ultramic.2015.11.006	journal	February 2016
Communication: Effects of thermionic-gun parameters on operating modes in ultrafast electron microscopy Kieft, Erik; Schliep, Karl B.; Suri, Pranav K. Structural Dynamics, Vol. 2, Issue 5 https://doi.org/10.1063/1.4930174	journal	September 2015
CW autocorrelation measurements of picosecond laser pulses Sala, K.; Kenney-Wallace, G.; Hall, G. IEEE Journal of Quantum Electronics, Vol. 16, Issue 9 https://doi.org/10.1109/JQE.1980.1070606	journal	September 1980
Generation and characterization of the highest laser intensities (10²² W/cm²) Bahk, S.-W.; Rousseau, P.; Planchon, T. A. Optics Letters, Vol. 29, Issue 24, p. 2837-2839 https://doi.org/10.1364/OL.29.002837	journal	January 2004
4D Nanoscale Diffraction Observed by Convergent-Beam Ultrafast Electron Microscopy Yurtsever, A.; Zewail, A. H. Science, Vol. 326, Issue 5953 https://doi.org/10.1126/science.1179314	journal	October 2009
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes Jing, Chunguang; Zhu, Yimei; Liu, Ao Ultramicroscopy, Vol. 207 https://doi.org/10.1016/j.ultramic.2019.112829	journal	December 2019
Photon-induced near-field electron microscopy Barwick, Brett; Flannigan, David J.; Zewail, Ahmed H. Nature, Vol. 462, Issue 7275 https://doi.org/10.1038/nature08662	journal	December 2009
Imaging phonon dynamics with ultrafast electron microscopy: Kinematical and dynamical simulations Du, Daniel X.; Flannigan, David J. Structural Dynamics, Vol. 7, Issue 2 https://doi.org/10.1063/1.5144682	journal	March 2020
Femtosecond thermionic emission from metals in the space-charge-limited regime Riffe, D. M.; More, R. M.; Wang, X. Y. Journal of the Optical Society of America B, Vol. 10, Issue 8 https://doi.org/10.1364/JOSAB.10.001424	journal	January 1993
Control of radiation damage in the TEM Egerton, R. F. Ultramicroscopy, Vol. 127 https://doi.org/10.1016/j.ultramic.2012.07.006	journal	April 2013
Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements Lau, June W.; Schliep, Karl B.; Katz, Michael B. Review of Scientific Instruments, Vol. 91, Issue 2 https://doi.org/10.1063/1.5131758	journal	February 2020
Few-nm tracking of current-driven magnetic vortex orbits using ultrafast Lorentz microscopy Möller, Marcel; Gaida, John H.; Schäfer, Sascha Communications Physics, Vol. 3, Issue 1 https://doi.org/10.1038/s42005-020-0301-y	journal	February 2020
Four-dimensional ultrafast electron microscopy Lobastov, V. A.; Srinivasan, R.; Zewail, A. H. Proceedings of the National Academy of Sciences, Vol. 102, Issue 20 https://doi.org/10.1073/pnas.0502607102	journal	May 2005
Defect-mediated phonon dynamics in TaS ₂ and WSe ₂ Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J. Structural Dynamics, Vol. 4, Issue 4 https://doi.org/10.1063/1.4982817	journal	July 2017
A new resolution quest in electron microscopy Idrobo, Juan Carlos Nature Reviews Materials, Vol. 6, Issue 2 https://doi.org/10.1038/s41578-020-00275-8	journal	December 2020
Femtosecond electron imaging of defect-modulated phonon dynamics Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms11230	journal	April 2016
Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS ₂ Flake McKenna, Alyssa J.; Eliason, Jeffrey K.; Flannigan, David J. Nano Letters, Vol. 17, Issue 6 https://doi.org/10.1021/acs.nanolett.7b01565	journal	May 2017
Ultrafast electron microscopy in materials science, biology, and chemistry King, Wayne E.; Campbell, Geoffrey H.; Frank, Alan Journal of Applied Physics, Vol. 97, Issue 11 https://doi.org/10.1063/1.1927699	journal	June 2005
Design and characterization of dielectric filled TM ₁₁₀ microwave cavities for ultrafast electron microscopy Verhoeven, W.; van Rens, J. F. M.; Kemper, A. H. Review of Scientific Instruments, Vol. 90, Issue 8 https://doi.org/10.1063/1.5080003	journal	August 2019
Conventional transmission electron microscopy Winey, Mark; Meehl, Janet B.; O'Toole, Eileen T. Molecular Biology of the Cell, Vol. 25, Issue 3 https://doi.org/10.1091/mbc.e12-12-0863	journal	February 2014
Ultrafast infrared spectroscopy Stoutland, P.; Dyer, R.; Woodruff, W. Science, Vol. 257, Issue 5078 https://doi.org/10.1126/science.1329200	journal	September 1992
Influence of Discrete Defects on Observed Acoustic–Phonon Dynamics in Layered Materials Probed with Ultrafast Electron Microscopy Reisbick, Spencer A.; Zhang, Yichao; Flannigan, David J. The Journal of Physical Chemistry A, Vol. 124, Issue 9 https://doi.org/10.1021/acs.jpca.9b12026	journal	February 2020
Characterization of aberrated laser beams Alda, Javier; Alonso, José; Bernabeu, Eusebio Journal of the Optical Society of America A, Vol. 14, Issue 10 https://doi.org/10.1364/JOSAA.14.002737	journal	January 1997
Forty Years of History of a Grating Interferometer Ronchi, Vasco Applied Optics, Vol. 3, Issue 4 https://doi.org/10.1364/AO.3.000437	journal	January 1964
Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes Plemmons, Dayne A.; Flannigan, David J. Chemical Physics Letters, Vol. 683 https://doi.org/10.1016/j.cplett.2017.01.055	journal	September 2017
Ultrafast electron optics: Propagation dynamics of femtosecond electron packets Siwick, Bradley J.; Dwyer, Jason R.; Jordan, Robert E. Journal of Applied Physics, Vol. 92, Issue 3 https://doi.org/10.1063/1.1487437	journal	August 2002
Photoemission sources and beam blankers for ultrafast electron microscopy Zhang, Lixin; Hoogenboom, Jacob P.; Cook, Ben Structural Dynamics, Vol. 6, Issue 5 https://doi.org/10.1063/1.5117058	journal	September 2019
Characterization of a time-resolved electron microscope with a Schottky field emission gun Olshin, Pavel K.; Drabbels, Marcel; Lorenz, Ulrich J. Structural Dynamics, Vol. 7, Issue 5 https://doi.org/10.1063/4.0000034	journal	September 2020
Dual mode microwave deflection cavities for ultrafast electron microscopy van Rens, J. F. M.; Verhoeven, W.; Kieft, E. R. Applied Physics Letters, Vol. 113, Issue 16 https://doi.org/10.1063/1.5049806	journal	October 2018
Direct visualization of electromagnetic wave dynamics by laser-free ultrafast electron microscopy Fu, Xuewen; Wang, Erdong; Zhao, Yubin Science Advances, Vol. 6, Issue 40 https://doi.org/10.1126/sciadv.abc3456	journal	October 2020
High quality ultrafast transmission electron microscopy using resonant microwave cavities Verhoeven, W.; van Rens, J. F. M.; Kieft, E. R. Ultramicroscopy, Vol. 188 https://doi.org/10.1016/j.ultramic.2018.03.012	journal	May 2018

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ultrafast transmission electron microscopy
UTEM
STEM
ultrafast pulser
pump-probe
RF chopped beam
instrumentation
copper mesh
instrument characterization
time-resolved instrument development
electron beam manipulation
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Title: Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines

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