Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope

Reisbick, Spencer A.; Han, Myung-Geun; Liu, Chuhang; Zhao, Yubin; Montgomery, Eric; Jing, Chunguang; Gokhale, Vikrant J.; Gorman, Jason J.; Lau, June W.; Zhu, Yimei

doi:10.1016/j.ultramic.2022.113497

Title: Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope

Journal Article · Thu Feb 17 00:00:00 EST 2022 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2022.113497· OSTI ID:1898588

^[1]; Han, Myung-Geun ^[1]; Liu, Chuhang ^[2]; Zhao, Yubin ^[3];

^[3]; Jing, Chunguang ^[3]; Gokhale, Vikrant J. ^[4];

^[4];

^[4]; Zhu, Yimei ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States); Stony Brook Univ., NY (United States)
Euclid Techlabs LLC, Bolingbrook, IL (United States)
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)

The development of ultrafast electron microscopy (UEM), specifically stroboscopic imaging, has brought the study of structural dynamics to a new level by overcoming the spatial limitations of ultrafast spectroscopy and the temporal restrictions of traditional TEM simultaneously. Combining the concepts governing both techniques has enabled direct visualization of dynamics with spatiotemporal resolutions in the picosecond-nanometer regime. Here, in this study, we push the limits of imaging using a pulsed electron beam via RF induced transverse deflection based on the newly developed 200 keV frequency-tunable strip-line pulser. We demonstrate 0.2 nm spatial resolution at high magnifications and elucidation of Lorentz imaging using the phase-microscopy method. We also present beam coherence measurements and expand our study using the breathing modes of a silicon interdigitated comb under RF excitation which achieves improved temporal synchronization between the electron pulse-train and electric field. A new RF holder has also been developed with impedance matching to the RF signal to minimize transmission power loss to samples and its performance is compared with a conventional sample holder.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States); Euclid Techlabs LLC, Bolingbrook, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

Grant/Contract Number:: SC0012704; SC0013121

OSTI ID:: 1898588

Alternate ID(s):: OSTI ID: 1845830

Report Number(s):: BNL-223710-2022-JAAM; TRN: US2310911

Journal Information:: Ultramicroscopy, Vol. 235; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

References (51)

Nanoscale Mechanical Drumming Visualized by 4D Electron Microscopy Kwon, Oh-Hoon; Barwick, Brett; Park, Hyun Soon Nano Letters, Vol. 8, Issue 11 https://doi.org/10.1021/nl8029866	journal	November 2008
Common reversal mechanisms and correlation between transient domain states and field sweep rate in patterned Permalloy structures Lau, J. W.; Beleggia, M.; Zhu, Y. Journal of Applied Physics, Vol. 102, Issue 4 https://doi.org/10.1063/1.2769779	journal	August 2007
Experimental comparison of two quantum computing architectures Linke, Norbert M.; Maslov, Dmitri; Roetteler, Martin Proceedings of the National Academy of Sciences, Vol. 114, Issue 13 https://doi.org/10.1073/pnas.1618020114	journal	March 2017
Ultrafast transmission electron microscopy using a laser-driven field emitter: Femtosecond resolution with a high coherence electron beam Feist, Armin; Bach, Nora; Rubiano da Silva, Nara Ultramicroscopy, Vol. 176 https://doi.org/10.1016/j.ultramic.2016.12.005	journal	May 2017
Realization of spin-wave logic gates Schneider, T.; Serga, A. A.; Leven, B. Applied Physics Letters, Vol. 92, Issue 2 https://doi.org/10.1063/1.2834714	journal	January 2008
Kikuchi ultrafast nanodiffraction in four-dimensional electron microscopy Yurtsever, A.; Zewail, A. H. Proceedings of the National Academy of Sciences, Vol. 108, Issue 8 https://doi.org/10.1073/pnas.1018733108	journal	January 2011
Spin transfer torque driven higher-order propagating spin waves in nano-contact magnetic tunnel junctions Houshang, A.; Khymyn, R.; Fulara, H. Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-018-06589-0	journal	October 2018
Aberrations of emission cathodes: Nanometer diameter field‐emission electron sources Scheinfein, M. R.; Qian, W.; Spence, J. C. H. Journal of Applied Physics, Vol. 73, Issue 5 https://doi.org/10.1063/1.353151	journal	March 1993
Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets VandenBussche, Elisah J.; Flannigan, David J. Nano Letters, Vol. 19, Issue 9 https://doi.org/10.1021/acs.nanolett.9b03074	journal	August 2019
Nanosecond electron pulses in the analytical electron microscopy of a fast irreversible chemical reaction Sinha, Shyam K.; Khammari, Amir; Picher, Matthieu Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-11669-w	journal	August 2019
Elementary relaxation processes investigated by femtosecond photoelectron spectroscopy of two-dimensional materials Bovensiepen, U.; Kirchmann, P. S. Laser & Photonics Reviews, Vol. 6, Issue 5 https://doi.org/10.1002/lpor.201000035	journal	February 2012
Phase reconstruction using fast binary 4D STEM data O'Leary, C. M.; Allen, C. S.; Huang, C. Applied Physics Letters, Vol. 116, Issue 12 https://doi.org/10.1063/1.5143213	journal	March 2020
On the transport of intensity technique for phase retrieval Beleggia, M.; Schofield, M. A.; Volkov, V. V. Ultramicroscopy, Vol. 102, Issue 1 https://doi.org/10.1016/j.ultramic.2004.08.004	journal	December 2004
Atomic-Resolution Imaging of Fast Nanoscale Dynamics with Bright Microsecond Electron Pulses Olshin, Pavel K.; Bongiovanni, Gabriele; Drabbels, Marcel Nano Letters, Vol. 21, Issue 1 https://doi.org/10.1021/acs.nanolett.0c04184	journal	December 2020
Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy Fu, Xuewen; Barantani, Francesco; Gargiulo, Simone Nature Communications, Vol. 11, Issue 1 https://doi.org/10.1038/s41467-020-19636-6	journal	November 2020
In Situ Observation of Nucleation and Crystallization of a Single Nanoparticle in Transparent Media Wang, Ting; Lu, Wei; Yang, Qihua The Journal of Physical Chemistry C, Vol. 124, Issue 28 https://doi.org/10.1021/acs.jpcc.0c03402	journal	June 2020
Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy Spence, J. C. H.; Qian, W.; Silverman, M. P. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 12, Issue 2 https://doi.org/10.1116/1.579166	journal	March 1994
Few-nm tracking of current-driven magnetic vortex orbits using ultrafast Lorentz microscopy Möller, Marcel; Gaida, John H.; Schäfer, Sascha Communications Physics, Vol. 3, Issue 1 https://doi.org/10.1038/s42005-020-0301-y	journal	February 2020
Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements Lau, June W.; Schliep, Karl B.; Katz, Michael B. Review of Scientific Instruments, Vol. 91, Issue 2 https://doi.org/10.1063/1.5131758	journal	February 2020
New carbon cone nanotip for use in a highly coherent cold field emission electron microscope Houdellier, Florent; Masseboeuf, Aurélien; Monthioux, Marc Carbon, Vol. 50, Issue 5 https://doi.org/10.1016/j.carbon.2012.01.023	journal	April 2012
Defect-mediated phonon dynamics in TaS ₂ and WSe ₂ Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J. Structural Dynamics, Vol. 4, Issue 4 https://doi.org/10.1063/1.4982817	journal	July 2017
Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS ₂ Flake McKenna, Alyssa J.; Eliason, Jeffrey K.; Flannigan, David J. Nano Letters, Vol. 17, Issue 6 https://doi.org/10.1021/acs.nanolett.7b01565	journal	May 2017
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe Erni, Rolf; Rossell, Marta D.; Kisielowski, Christian Physical Review Letters, Vol. 102, Issue 9 https://doi.org/10.1103/PhysRevLett.102.096101	journal	March 2009
Ultrafast Electron Microscopy Visualizes Acoustic Vibrations of Plasmonic Nanorods at the Interfaces Kim, Ye-Jin; Jung, Hayoon; Han, Sang Woo Matter, Vol. 1, Issue 2 https://doi.org/10.1016/j.matt.2019.03.004	journal	August 2019
Nanoscale diffractive probing of strain dynamics in ultrafast transmission electron microscopy Feist, Armin; Rubiano da Silva, Nara; Liang, Wenxi Structural Dynamics, Vol. 5, Issue 1 https://doi.org/10.1063/1.5009822	journal	January 2018
Partially coherent fields, the transport-of-intensity equation, and phase uniqueness Gureyev, T. E.; Roberts, A.; Nugent, K. A. Journal of the Optical Society of America A, Vol. 12, Issue 9 https://doi.org/10.1364/JOSAA.12.001942	journal	January 1995
Photoemission sources and beam blankers for ultrafast electron microscopy Zhang, Lixin; Hoogenboom, Jacob P.; Cook, Ben Structural Dynamics, Vol. 6, Issue 5 https://doi.org/10.1063/1.5117058	journal	September 2019
Transmission of electrical signals by spin-wave interconversion in a magnetic insulator Kajiwara, Y.; Harii, K.; Takahashi, S. Nature, Vol. 464, Issue 7286 https://doi.org/10.1038/nature08876	journal	March 2010
Direct visualization of electromagnetic wave dynamics by laser-free ultrafast electron microscopy Fu, Xuewen; Wang, Erdong; Zhao, Yubin Science Advances, Vol. 6, Issue 40 https://doi.org/10.1126/sciadv.abc3456	journal	October 2020
High quality ultrafast transmission electron microscopy using resonant microwave cavities Verhoeven, W.; van Rens, J. F. M.; Kieft, E. R. Ultramicroscopy, Vol. 188 https://doi.org/10.1016/j.ultramic.2018.03.012	journal	May 2018
Lattice Parameter of Thin Gold Films Vook, R. W.; Otooni, M. A. Journal of Applied Physics, Vol. 39, Issue 5 https://doi.org/10.1063/1.1656581	journal	April 1968
Variation of domain-wall structures and magnetization ripple spectra in permalloy films with controlled uniaxial anisotropy Gentils, A.; Chapman, J. N.; Xiong, G. Journal of Applied Physics, Vol. 98, Issue 5 https://doi.org/10.1063/1.2033152	journal	September 2005
Study on the Structure of Evaporated Gold Particles by Means of a High Resolution Electron Microscope Komoda, Tsutomu Japanese Journal of Applied Physics, Vol. 7, Issue 1 https://doi.org/10.1143/JJAP.7.27	journal	January 1968
The wavelength-dispersive spectrometer and its proposed use in the Analytical Electron Microscope Goldstein, Joseph I.; Lyman, Charles E.; Williams, David B. Ultramicroscopy, Vol. 28, Issue 1-4 https://doi.org/10.1016/0304-3991(89)90289-1	journal	April 1989
Coupled quantum dots as quantum gates Burkard, Guido; Loss, Daniel; DiVincenzo, David P. Physical Review B, Vol. 59, Issue 3 https://doi.org/10.1103/PhysRevB.59.2070	journal	January 1999
Four-dimensional ultrafast electron microscopy of phase transitions Grinolds, M. S.; Lobastov, V. A.; Weissenrieder, J. Proceedings of the National Academy of Sciences, Vol. 103, Issue 49 https://doi.org/10.1073/pnas.0609233103	journal	November 2006
Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy Vogel, J.; Kuch, W.; Bonfim, M. Applied Physics Letters, Vol. 82, Issue 14 https://doi.org/10.1063/1.1564876	journal	April 2003
Experimental evaluation of the ‘transport-of-intensity’ equation for magnetic phase reconstruction in Lorentz transmission electron microscopy Kohn, Amit; Habibi, Avihay; Mayo, Martin Ultramicroscopy, Vol. 160 https://doi.org/10.1016/j.ultramic.2015.09.011	journal	January 2016
Lorentz phase microscopy of magnetic materials Volkov, V. V.; Zhu, Y. Ultramicroscopy, Vol. 98, Issue 2-4 https://doi.org/10.1016/j.ultramic.2003.08.026	journal	January 2004
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes Jing, Chunguang; Zhu, Yimei; Liu, Ao Ultramicroscopy, Vol. 207 https://doi.org/10.1016/j.ultramic.2019.112829	journal	December 2019
Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization MacLaren, Ian; Macgregor, Thomas A.; Allen, Christopher S. APL Materials, Vol. 8, Issue 11 https://doi.org/10.1063/5.0026992	journal	November 2020
Time-resolved imaging of nonlinear magnetic domain-wall dynamics in ferromagnetic nanowires Stein, Falk-Ulrich; Bocklage, Lars; Weigand, Markus Scientific Reports, Vol. 3, Issue 1 https://doi.org/10.1038/srep01737	journal	April 2013
Direct correlation of reversal rate dynamics to domain configurations in micron-sized permalloy elements Lau, J. W.; Beleggia, M.; Schofield, M. A. Journal of Applied Physics, Vol. 97, Issue 10 https://doi.org/10.1063/1.1851731	journal	May 2005
Electron diffraction using transmission electron microscopy Bendersky, L. A.; Gayle, F. W. Journal of Research of the National Institute of Standards and Technology, Vol. 106, Issue 6 https://doi.org/10.6028/jres.106.051	journal	November 2001
Influence of Discrete Defects on Observed Acoustic–Phonon Dynamics in Layered Materials Probed with Ultrafast Electron Microscopy Reisbick, Spencer A.; Zhang, Yichao; Flannigan, David J. The Journal of Physical Chemistry A, Vol. 124, Issue 9 https://doi.org/10.1021/acs.jpca.9b12026	journal	February 2020
Radiation damage relative to transmission electron microscopy of biological specimens at low temperature: a review Glaeser, Robert M.; Taylor, Kenneth A. Journal of Microscopy, Vol. 112, Issue 1 https://doi.org/10.1111/j.1365-2818.1978.tb01160.x	journal	January 1978
Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes Plemmons, Dayne A.; Flannigan, David J. Chemical Physics Letters, Vol. 683 https://doi.org/10.1016/j.cplett.2017.01.055	journal	September 2017
Direct electron detection methods in electron microscopy Faruqi, A. R.; Cattermole, D. M.; Raeburn, C. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 513, Issue 1-2 https://doi.org/10.1016/j.nima.2003.08.055	journal	November 2003
Sub-ångstrom resolution using aberration corrected electron optics Batson, P. E.; Dellby, N.; Krivanek, O. L. Nature, Vol. 418, Issue 6898 https://doi.org/10.1038/nature00972	journal	August 2002
Direct imaging detectors for electron microscopy Faruqi, A. R.; McMullan, G. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 878 https://doi.org/10.1016/j.nima.2017.07.037	journal	January 2018
Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials Zhang, Daliang; Zhu, Yihan; Liu, Lingmei Science, Vol. 359, Issue 6376 https://doi.org/10.1126/science.aao0865	journal	January 2018

Similar Records

Direct visualization of electromagnetic wave dynamics by laser-free ultrafast electron microscopy

Journal Article · Fri Oct 02 00:00:00 EDT 2020 · Science Advances · OSTI ID:1898588

Fu, Xuewen; Wang, Erdong; Zhao, Yubin; +7 more

Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes

Journal Article · Mon Aug 26 00:00:00 EDT 2019 · Ultramicroscopy · OSTI ID:1898588

Jing, Chunguang; Zhu, Yimei; Liu, Ao; +8 more

Imaging Nanoscale Energy Transport and Conversion with Ultrafast Electron Microscopy (Final Technical Report)

Technical Report · Thu Jun 08 00:00:00 EDT 2023 · OSTI ID:1898588

Flannigan, David J.

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
47 OTHER INSTRUMENTATION
ultrafast electron microscopy
electron pulser
frequency-tunable RF excitation
time-resolved stroboscopic imaging
coherent electron pulses
ultrafast TEM
Ultrafast TEM
Frequency-tunable RF excitation

Title: Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope

Citation Formats

References (51)

Similar Records

Related Subjects