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Development of a creep model informed by lower-length scale simulations to simulate creep in doped UO2

Technical Report ·
DOI:https://doi.org/10.2172/1962764· OSTI ID:1962764

Using molecular dynamics, we predict information at the atomistic scale used to develop a mechanistic UO2 creep model for use in higher length-scale fuel performance codes. The ultimate objective of the model is to better describe the grain size dependence and therefore impact of doping on creep rates in UO2. In a previous NEAMS milestone, we found that Nabarro-Herring (bulk diffusional) creep was too low to capture the experimentally observed creep rates in standard UO2. Moreover, in that milestone, other mechanisms were explored, such as Coble (grain boundary) creep and dislocation climb, with each mechanism exhibiting different grain size dependencies. Again, these were orders of magnitude too low to describe the experimental creep rates. In this work, we address the previous assumptions made for the Coble creep mechanism by investigating the diffusivity of various defects at grain boundaries in UO2 and, critically, to determine if enhanced grain boundary diffusivity allows the model to better reproduce experimental results. The diffusivity as a function of temperature for different concentrations of uranium vacancies and interstitials for bulk UO2 have also been examined using cluster dynamics. Furthermore, using a concentration dependent segregation model, the concentration of defects at the grain boundary were predicted. This atomistic data was then input into the various creep mechanisms and the creep rates compared to the empirical MATPRO correlation (used in BISON) and experiment.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE Office of Nuclear Energy (NE), Nuclear Energy Advanced Modeling and Simulation (NEAMS); USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
89233218CNA000001
OSTI ID:
1962764
Report Number(s):
LA-UR-22-27950
Country of Publication:
United States
Language:
English

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