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Extended Oxygen Octahedral Tilt Proximity near Oxide Heterostructures

Journal Article · · Nano Letters
 [1];  [1];  [2];  [3];  [1];  [1];  [1];  [4];  [5];  [1];  [1]
  1. Institute for Basic Science (IBS), Seoul (Korea, Republic of); Seoul National University, Seoul (Korea, Republic of)
  2. Ulsan National Institute of Science and Technology (UNIST), Ulsan (Korea, Republic of)
  3. Seoul National University, Seoul (Korea, Republic of)
  4. Brookhaven National Laboratory (BNL), Upton, NY (United States). Condensed Matter Physics
  5. Ulsan National Institute of Science and Technology (Korea, Republic of)
The oxide interfaces between materials with different structural symmetries have been actively studied due to their novel physical properties. However, the investigation of intriguing interfacial phenomena caused by the oxygen octahedral tilt (OOT) proximity effect has not been fully exploited, as there is still no clear understanding of what determines the proximity length and what the underlying control mechanism is. Here, we achieved scalability of the OOT proximity effect in SrRuO3 (SRO) by epitaxial strain near the SRO/SrTiO3 heterointerface. We demonstrated that the OOT proximity length scale of SRO is extended from 4 unit cells to 14 unit cells by employing advanced scanning transmission electron microscopy. We also suggest that this variation may originate from changes in phonon dispersions due to electron-phonon coupling in SRO. Here, this study will provide in-depth insights into the structural gradients of correlated systems and facilitate potential device applications.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
Institute for Basic Science (IBS); National Research Foundation of Korea (NRF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
SC0012704
OSTI ID:
1961786
Report Number(s):
BNL-224137-2023-JAAM
Journal Information:
Nano Letters, Journal Name: Nano Letters Journal Issue: 3 Vol. 23; ISSN 1530-6984
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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