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Structural properties of ferroelectric heterostructures using coherent bragg rod analysis

Journal Article · · Current Applied Physics
 [1];  [2];  [1];  [3];  [4];  [1]
  1. Chung-Ang Univ., Seoul (Korea)
  2. Inst. for Basic Science (IBS), Seoul (Korea, Republic of); Seoul National Univ. (Korea, Republic of); Yale Univ., New Haven, CT (United States)
  3. Inst. for Basic Science (IBS), Seoul (Korea, Republic of); Seoul National Univ. (Korea, Republic of)
  4. Argonne National Lab. (ANL), Lemont, IL (United States)
We investigated the crystal structure of SrRuO3/BaTiO3/SrRuO3 (SRO/BTO/SRO) heterostructures grown on a SrTiO3 (001) substrate using surface X-ray scattering. The interface structure of SRO/BTO/SRO heterostructures can decrease the critical thickness of ferroelectric BTO films reduced to 3.5 unit cells. Owing to weak intensity of ultrathin films, lab-source-based X-ray measurement cannot determine the atomic arrangement of the heterostructures and their lattice parameters. We introduced synchrotron-based X-ray scattering techniques combined with coherent Bragg rod analysis (COBRA) to resolve the details of the heterostructures. Here, we obtained detailed crystal structural information based on the electron density profiles of the SRO/BTO/SRO heterostructures acquired from COBRA results, e.g., lattice parameters and atomic arrangements.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
Chung-Ang Univ.; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1756862
Alternate ID(s):
OSTI ID: 1703043
OSTI ID: 1604177
Journal Information:
Current Applied Physics, Journal Name: Current Applied Physics Journal Issue: 4 Vol. 20; ISSN 1567-1739
Publisher:
Korean Physical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

References (22)

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