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Classification of computed thermal tomography images with deep learning convolutional neural network

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/5.0089072· OSTI ID:1960738
 [1];  [2];  [3];  [3]
  1. Argonne National Lab. (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States); Georgia Inst. of Technology, Atlanta, GA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Thermal tomography (TT) is a computational method for the reconstruction of depth profile of the internal material defects from Pulsed Infrared Thermography (PIT) nondestructive evaluation. Here, the PIT method consists of recording material surface temperature transients with a fast frame infrared camera, following thermal pulse deposition on the material surface with a flashlamp and heat diffusion into material bulk. TT algorithm obtains depth reconstructions of thermal effusivity, which has been shown to provide visualization of the subsurface internal defects in metals. In many applications, one needs to determine the defect shape and orientation from reconstructed effusivity images. Interpretation of TT images is non-trivial because of blurring, which increases with depth due to the heat diffusion-based nature of image formation. We have developed a deep learning convolutional neural network (CNN) to classify the size and orientation of subsurface material defects in TT images. CNN was trained with TT images produced with computer simulations of 2D metallic structures (thin plates) containing elliptical subsurface voids. The performance of CNN was investigated using test TT images developed with computer simulations of plates containing elliptical defects, and defects with shapes imported from scanning electron microscopy images. CNN demonstrated the ability to classify radii and angular orientation of elliptical defects in previously unseen test TT images. We have also demonstrated that CNN trained on the TT images of elliptical defects is capable of classifying the shape and orientation of irregular defects.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE; USDOE Office of Nuclear Energy (NE), Nuclear Energy Enabling Technologies (NEET)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1960738
Alternate ID(s):
OSTI ID: 1873958
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 24 Vol. 131; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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  • Lim, Wei Hng; Sfarra, Stefano; Yao, Yuan
  • International Workshop on Advanced Infrared Technology and Applications, The 16th International Workshop on Advanced Infrared Technology & Applications https://doi.org/10.3390/engproc2021008014
conference November 2021