The deposition of thick B4C films with low residual stress by conventional direct-current magnetron sputtering is accompanied by the formation of dust particulates contaminating the target, chamber, and substrates and leading to the formation of nodular defects in films. Here, we demonstrate that the formation of particulates is greatly reduced during radio-frequency magnetron sputtering (RFMS). We systematically study properties of B4C films deposited by RFMS with a substrate temperature of 330 °C, a target-to-substrate distance of 10 cm, Ar working gas pressure in the range of 4.5–12.0 mTorr (0.6–1.6 Pa), and substrate tilt angles of 0°–80°. All films are x-ray amorphous. A columnar structure develops with increasing either Ar pressure or substrate tilt. For columnar films, the column tilt angle decreases with increasing Ar pressure, which we attribute to a corresponding increase in the width of the distribution of impact angles of deposition flux. In contrast to the Keller–Simmons rule, the deposition rate increases with increasing Ar pressure, which suggests a better coupling of the RF energy to the plasma processes that lead to target sputtering at higher pressures. There is a critical substrate tilt angle above which the total residual stress is close to zero. This critical substrate tilt angle is ~0° for an Ar pressure of 12 mTorr (1.6 Pa). The lower residual stress state, necessary for depositing ultrathick films, is characterized by a larger concentration of nanoscale inhomogeneities and decreased mechanical properties. Based on these results, RFMS deposition of 60-μm-thick B4C films is demonstrated.
Bayu Aji, L. B., et al. "Radio-frequency magnetron sputter deposition of ultrathick boron carbide films." Journal of Vacuum Science and Technology A, vol. 41, no. 2, Feb. 2023. https://doi.org/10.1116/6.0002211
Bayu Aji, L. B., Shin, S. J., Bae, J. H., Engwall, A. M., Hammons, J. A., Sen-Britain, S. T., Mirkarimi, P. B., & Kucheyev, S. O. (2023). Radio-frequency magnetron sputter deposition of ultrathick boron carbide films. Journal of Vacuum Science and Technology A, 41(2). https://doi.org/10.1116/6.0002211
Bayu Aji, L. B., Shin, S. J., Bae, J. H., et al., "Radio-frequency magnetron sputter deposition of ultrathick boron carbide films," Journal of Vacuum Science and Technology A 41, no. 2 (2023), https://doi.org/10.1116/6.0002211
@article{osti_1959430,
author = {Bayu Aji, L. B. and Shin, S. J. and Bae, J. H. and Engwall, A. M. and Hammons, J. A. and Sen-Britain, S. T. and Mirkarimi, P. B. and Kucheyev, S. O.},
title = {Radio-frequency magnetron sputter deposition of ultrathick boron carbide films},
annote = {The deposition of thick B4C films with low residual stress by conventional direct-current magnetron sputtering is accompanied by the formation of dust particulates contaminating the target, chamber, and substrates and leading to the formation of nodular defects in films. Here, we demonstrate that the formation of particulates is greatly reduced during radio-frequency magnetron sputtering (RFMS). We systematically study properties of B4C films deposited by RFMS with a substrate temperature of 330 °C, a target-to-substrate distance of 10 cm, Ar working gas pressure in the range of 4.5–12.0 mTorr (0.6–1.6 Pa), and substrate tilt angles of 0°–80°. All films are x-ray amorphous. A columnar structure develops with increasing either Ar pressure or substrate tilt. For columnar films, the column tilt angle decreases with increasing Ar pressure, which we attribute to a corresponding increase in the width of the distribution of impact angles of deposition flux. In contrast to the Keller–Simmons rule, the deposition rate increases with increasing Ar pressure, which suggests a better coupling of the RF energy to the plasma processes that lead to target sputtering at higher pressures. There is a critical substrate tilt angle above which the total residual stress is close to zero. This critical substrate tilt angle is ~0° for an Ar pressure of 12 mTorr (1.6 Pa). The lower residual stress state, necessary for depositing ultrathick films, is characterized by a larger concentration of nanoscale inhomogeneities and decreased mechanical properties. Based on these results, RFMS deposition of 60-μm-thick B4C films is demonstrated.},
doi = {10.1116/6.0002211},
url = {https://www.osti.gov/biblio/1959430},
journal = {Journal of Vacuum Science and Technology A},
issn = {ISSN 0734-2101},
number = {2},
volume = {41},
place = {United States},
publisher = {American Vacuum Society / AIP},
year = {2023},
month = {02}}