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Title: Electronic Reconstruction at SrMnO 3 LaMnO 3 Superlattice Interfaces

Journal Article · · Physical Review Letters
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  1. Univ. of Illinois, Urbana, IL (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Univ. of Hamburg (Germany)

We use resonant soft–x-ray scattering (RSXS) to study the electronic reconstruction at the interface between the Mott insulator LaMnO3 and the band insulator SrMnO3. Superlattices of these two insulators were shown previously to have both ferromagnetism and metallic tendencies [Koida et al., Phys. Rev. B 66, 144418 (2002)]. By studying a judiciously chosen superlattice reflection, we show that the interface density of states exhibits a pronounced peak at the Fermi level, similar to that predicted in related titanate superlattices by Okamoto et al. [Phys. Rev. B 70, 241104(R) (2004)]. The intensity of this peak correlates with the conductivity and magnetization, suggesting it is the driver of metallic behavior. Here, our study demonstrates a general strategy for using RSXS to probe the electronic properties of heterostructure interfaces.

Research Organization:
Univ. of Illinois at Urbana-Champaign, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
FG02-06ER46285; AC02-06CH11357; AC02-98CH10886
OSTI ID:
1958861
Journal Information:
Physical Review Letters, Vol. 99, Issue 19; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 135 works
Citation information provided by
Web of Science

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