Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Molecular dynamics studies of the ion beam induced crystallization in silicon

Conference ·
OSTI ID:192448

We have studied the ion bombardment induced amorphous-to-crystal transition in silicon using molecular dynamics techniques. The growth of small crystal seeds embedded in the amorphous phase has been monitored for several temperatures in order to get information on the effect of the thermal temperature increase introduced by the incoming ion. The role of ion-induced defects on the growth has been also studied.

Research Organization:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
192448
Report Number(s):
UCRL-JC--122973; CONF-951155--44; ON: DE96005391
Country of Publication:
United States
Language:
English

Similar Records

Ion beam induced recrystallization of amorphous silicon: A molecular dynamics study
Journal Article · Sat Nov 30 23:00:00 EST 1996 · Journal of Applied Physics · OSTI ID:389263

Dose rate dependence and time constant of the ion-beam-induced crystallization mechanism in silicon
Journal Article · Mon Dec 14 23:00:00 EST 1987 · J. Appl. Phys.; (United States) · OSTI ID:5977504

Ion-beam processing of silicon at keV energies: A molecular-dynamics study
Journal Article · Sat Nov 30 23:00:00 EST 1996 · Physical Review, B: Condensed Matter · OSTI ID:404030