Infrared microspectroscopy at the diffraction limit with synchrotron radiation
- Spectra-Tech, Inc., Shelton, CT (United States)
Synchrotron radiation is approximately 100-1000 times brighter than conventional infrared sources, highly-collimated, and extremely stable. We have evaluated the performance of an infrared microscope coupled to a synchrotron beam at the Brookhaven National Laboratory in Upton, NY, and have found that the beam size at the sample is limited only by diffraction. Specifically, with a 15X objective (N.A. 0.58), the size of the source at the sample is calculated to be 6 x 12{mu}m. With a 32X objective (N.A. 0.65), the source size at the sample is 3 x 6 {mu}m. In order to test the resolution and performance of the system, a multi-layered laminate film was analyzed. This film consisted of layers 4,6,8, and 32 microns wide. A series of absorbance spectra were recorded across the layers in steps, acquiring 16 scans at each location. Each spectrum took approximately 15 seconds to acquire. The authors were able to clearly differentiate and identify the layers, demonstrating that synchrotron radiation is ideal as a source for infrared microspectroscopy. With the energy this source gives, high signal-to-noise spectra can be obtained in a matter of seconds on sample sizes approaching the diffraction limit.
- OSTI ID:
- 191745
- Report Number(s):
- CONF-941098--
- Country of Publication:
- United States
- Language:
- English
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