Topography of bent crystals with microradian resolution in one dimension

Pereira, N. R.; Macrander, A. T.; Harding, E. C.

doi:10.1063/5.0098994

Topography of bent crystals with microradian resolution in one dimension

Journal Article · Sun Nov 13 23:00:00 EST 2022 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0098994· OSTI ID:1898153

; ; Harding, E. C.

Optimum performance in x-ray imaging and spectroscopy of plasmas with bent crystals is achievable only when the crystal reflects the x rays theoretically perfectly across its entire surface. However, typical thin quartz (101̄1) crystal samples kept flat by direct attachment to a flat substrate reflect 8 keV x rays differently across their surface, on a scale comparable to the ideal rocking curve. Additional processing improves the uniformity. Irradiation of flat crystals with collimated, monochromatic x rays in rocking curve topography shows such problems directly, with microradian resolution. Nonuniform x-ray reflection is more difficult to document for strongly bent crystals because, then, monochromatic, collimated x rays satisfy the Bragg condition only along a narrow stripe that may be too narrow to resolve with the available cameras. However, it can be resolved with a knife edge that moves through the reflected x rays with the necessary spatial precision as demonstrated here for a bent silicon crystal. This shows qualitatively similar imperfections in the reflection as flat quartz and as the bent quartz analyzers reported on previously with lower resolution.

View Accepted Manuscript (Publisher)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-06CH11357; NA0003525

OSTI ID:: 1898153

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 11 Vol. 93; ISSN 0034-6748

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

References (18)

Relative x-ray collection efficiency, spatial resolution, and spectral resolution of spherically-bent quartz, mica, germanium, and pyrolytic graphite crystals Ao, T.; Harding, E. C.; Bailey, J. E. Journal of Quantitative Spectroscopy and Radiative Transfer, Vol. 144 https://doi.org/10.1016/j.jqsrt.2014.03.023	journal	September 2014
Spherical quartz crystals investigated with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Hill, K. W. Review of Scientific Instruments, Vol. 86, Issue 10 https://doi.org/10.1063/1.4934197	journal	October 2015
X-ray optics testing beamline 1-BM at the advanced photon source Macrander, Albert; Erdmann, Mark; Kujala, Naresh PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings https://doi.org/10.1063/1.4952853	conference	January 2016
Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source Stoupin, Stanislav; Shvyd’ko, Yuri; Trakhtenberg, Emil PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings https://doi.org/10.1063/1.4952940	conference	January 2016
Systematic search for spherical crystal X-ray microscopes matching 1–25 keV spectral line sources Schollmeier, Marius S.; Loisel, Guillaume P. Review of Scientific Instruments, Vol. 87, Issue 12 https://doi.org/10.1063/1.4972248	journal	December 2016
Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging Stoeckl, C.; Filkins, T.; Jungquist, R. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5036525	journal	October 2018
On evaluating x-ray imaging crystals with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Stoeckl, C. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5045569	journal	October 2018
Catalyzed chemical polishing of SiO ₂ glasses in pure water Toh, Daisetsu; Bui, Pho Van; Isohashi, Ai Review of Scientific Instruments, Vol. 90, Issue 4 https://doi.org/10.1063/1.5090320	journal	April 2019
Detailed diffraction imaging of x-ray optics crystals with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Kasman, E. Review of Scientific Instruments, Vol. 92, Issue 6 https://doi.org/10.1063/5.0040584	journal	June 2021
On the reflection properties of germanium and quartz focusing crystals Baronova, E. O.; Subbotin, I. A.; Lomov, A. A. Journal of Physics: Conference Series, Vol. 774 https://doi.org/10.1088/1742-6596/774/1/012117	journal	November 2016
X-ray reflection properties of elastically bent perfect crystals in Bragg geometry Uschmann, I.; Förster, E.; Gäbel, K. Journal of Applied Crystallography, Vol. 26, Issue 3 https://doi.org/10.1107/s0021889892013025	journal	June 1993
Simulation of X-ray diffraction profiles for bent anisotropic crystals Sanchez del Rio, Manuel; Perez-Bocanegra, Nicolas; Shi, Xianbo Journal of Applied Crystallography, Vol. 48, Issue 2 https://doi.org/10.1107/s1600576715002782	journal	March 2015
Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications Huang, Xian-Rong; Gog, Thomas; Kim, Jungho Journal of Applied Crystallography, Vol. 51, Issue 1 https://doi.org/10.1107/s1600576717018155	journal	February 2018
Quartz conditioning crystal for X-ray rocking curve topography Macrander, Albert; Pereira, Nino; Stoeckl, Christian Journal of Applied Crystallography, Vol. 52, Issue 1 https://doi.org/10.1107/s160057671801823x	journal	February 2019
High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering Said, Ayman H.; Gog, Thomas; Wieczorek, Michael Journal of Synchrotron Radiation, Vol. 25, Issue 2 https://doi.org/10.1107/s1600577517018185	journal	February 2018
X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses Kaganer, Vladimir M.; Petrov, Ilia; Samoylova, Liubov Acta Crystallographica Section A Foundations and Advances, Vol. 76, Issue 1 https://doi.org/10.1107/s2053273319014347	journal	January 2020
Status of XOP: an x-ray optics software toolkit Sanchez del Rio, Manuel; Dejus, Roger J. Optical Science and Technology, the SPIE 49th Annual Meeting, SPIE Proceedings https://doi.org/10.1117/12.560903	conference	October 2004
High-resolution monochromatic x-ray imaging system based on spherically bent crystals Aglitskiy, Yefim; Lehecka, Thomas; Obenschain, Stephen Applied Optics, Vol. 37, Issue 22 https://doi.org/10.1364/ao.37.005253	journal	January 1998

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