Detailed diffraction imaging of x-ray optics crystals with synchrotron radiation

Pereira, N. R.; Macrander, A. T.; Kasman, E.; Huang, X. -R.; Baronova, E. O.

doi:10.1063/5.0040584

Detailed diffraction imaging of x-ray optics crystals with synchrotron radiation

Journal Article · Wed Jun 02 00:00:00 EDT 2021 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0040584· OSTI ID:1813041

^[1]; ^[2]; ^[2]; Huang, X. -R. ^[2]; Baronova, E. O. ^[3]

Ecopulse, Inc., Springfield, VA (United States)
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
National Research Centre, Moscow (Russian Federation). Kurchatov Institute

Rocking curve topography at the Advanced Photon Source’s beamline 1-BM measures the x-ray reflection from large (many cm²) flat crystals on a sub-mm scale with microradian angular resolution. The $$(01\bar{1}1)$$ reflection at 8 keV is uniform across the crystal and close to theory for three thick quartz wafers well-polished with increasingly finer grit. However, the reflection is non-uniform for some ~ 0.1mmthin, bendable crystals that are made flat by optical contact with a flat substrate. Here, these thin crystals are bent to serve in certain x-ray diagnostics of plasmas, and similar non-uniformities could then occur in bent crystals as well. The same detail in x-ray reflection in bent crystals is unachievable with the existing topography setup: one way to get the desired resolution is with a standard microfocusing approach.

Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1813041

Alternate ID(s):: OSTI ID: 1785584

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 92; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (13)

Relative x-ray collection efficiency, spatial resolution, and spectral resolution of spherically-bent quartz, mica, germanium, and pyrolytic graphite crystals Ao, T.; Harding, E. C.; Bailey, J. E. Journal of Quantitative Spectroscopy and Radiative Transfer, Vol. 144 https://doi.org/10.1016/j.jqsrt.2014.03.023	journal	September 2014
Spherical quartz crystals investigated with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Hill, K. W. Review of Scientific Instruments, Vol. 86, Issue 10 https://doi.org/10.1063/1.4934197	journal	October 2015
X-ray optics testing beamline 1-BM at the advanced photon source Macrander, Albert; Erdmann, Mark; Kujala, Naresh PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings https://doi.org/10.1063/1.4952853	conference	January 2016
Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source Stoupin, Stanislav; Shvyd’ko, Yuri; Trakhtenberg, Emil PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings https://doi.org/10.1063/1.4952940	conference	January 2016
Note: Narrow x-ray reflections are easier to locate with sandpaper Pereira, N. R.; Macrander, A. T. Review of Scientific Instruments, Vol. 89, Issue 2 https://doi.org/10.1063/1.5019463	journal	February 2018
Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging Stoeckl, C.; Filkins, T.; Jungquist, R. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5036525	journal	October 2018
On evaluating x-ray imaging crystals with synchrotron radiation Pereira, N. R.; Macrander, A. T.; Stoeckl, C. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5045569	journal	October 2018
Catalyzed chemical polishing of SiO ₂ glasses in pure water Toh, Daisetsu; Bui, Pho Van; Isohashi, Ai Review of Scientific Instruments, Vol. 90, Issue 4 https://doi.org/10.1063/1.5090320	journal	April 2019
Phase objects in synchrotron radiation hard x-ray imaging Cloetens, Peter; Barrett, Raymond; Baruchel, José Journal of Physics D: Applied Physics, Vol. 29, Issue 1 https://doi.org/10.1088/0022-3727/29/1/023	journal	January 1996
Simulation of X-ray diffraction profiles for bent anisotropic crystals Sanchez del Rio, Manuel; Perez-Bocanegra, Nicolas; Shi, Xianbo Journal of Applied Crystallography, Vol. 48, Issue 2 https://doi.org/10.1107/S1600576715002782	journal	March 2015
Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications Huang, Xian-Rong; Gog, Thomas; Kim, Jungho Journal of Applied Crystallography, Vol. 51, Issue 1 https://doi.org/10.1107/s1600576717018155	journal	February 2018
Small Bragg-plane slope errors revealed in synthetic diamond crystals Pradhan, Paresh; Wojcik, Michael; Huang, Xianrong Journal of Synchrotron Radiation, Vol. 27, Issue 6 https://doi.org/10.1107/s1600577520012746	journal	October 2020
Status of XOP: an x-ray optics software toolkit Sanchez del Rio, Manuel; Dejus, Roger J. Optical Science and Technology, the SPIE 49th Annual Meeting, SPIE Proceedings https://doi.org/10.1117/12.560903	conference	October 2004

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Detailed diffraction imaging of x-ray optics crystals with synchrotron radiation

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References (13)

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