A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

Nazaretski, E.; Coburn, D. S.; Xu, W.; Ma, J.; Xu, H.; Smith, R.; Huang, X.; Yang, Y.; Huang, L.; Idir, M.; Kiss, A.; Chu, Y. S.

doi:10.1107/s1600577522007056

A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

Journal Article · Fri Jul 29 00:00:00 EDT 2022 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/s1600577522007056· OSTI ID:1889157

^[1]; Coburn, D. S. ^[1]; Xu, W. ^[1]; Ma, J. ^[1]; Xu, H. ^[1]; Smith, R. ^[1]; ^[1]; Yang, Y. ^[1]; Huang, L. ^[1]; Idir, M. ^[1]; Kiss, A. ^[1]; Chu, Y. S. ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick–Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704

OSTI ID:: 1889157

Report Number(s):: BNL-223457-2022-JAAM

Journal Information:: Journal of Synchrotron Radiation (Online), Journal Name: Journal of Synchrotron Radiation (Online) Journal Issue: 5 Vol. 29; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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