5-ID SRX Beamline Radiation Shielding Analysis

Technical Report · Thu Aug 07 00:00:00 EDT 2014

DOI:https://doi.org/10.2172/1493217· OSTI ID:1493217

Xia, Zhenghua ^[1]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States)

This note documents the radiation shielding analysis of Submicron Resolution X-ray Spectroscopy (SRX, 5 ID) beamline at 500 mA, including Gas Bremsstrahlung (GB) and Synchrotron Radiation (SR).

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
• DOE Contract Number: SC0012704
• OSTI ID: 1493217
• Report Number(s): NSLSII-ESH-TN--138; BNL--210972-2019-TECH
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE