Response of Integrated Silicon Microwave pin Diodes to X-ray and Fast-Neutron Irradiation.

Conference · Tue Jun 01 00:00:00 EDT 2021

DOI:https://doi.org/10.2172/1888707· OSTI ID:1888707

Teng, Jeffrey W.; Nergui, D.; Parameswaran, H.; Sep�lveda-Ramos, N. E.; Tzintzarov, G. N.; Mensah, Y.; Cheon, C. D.; Rao, S. G.; Ringel, B.; Gorchichko, M.; Li, K.; Ying, H.; Ildefonso, A.; Dodds, Nathaniel; Nowlin, Robert; Zhang, E. X.; Fleetwood, D. M.; Cressler, J. D.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 1888707
• Report Number(s): SAND2021-7715C; 699828
• Country of Publication: United States
• Language: English