Mid‐ to Far‐Infrared Anisotropic Dielectric Function of HfS 2 and HfSe 2

Kowalski, Ryan A.; Nolen, Joshua Ryan; Varnavides, Georgios; Silva, Sebastian Mika; Allen, Jack E.; Ciccarino, Christopher J.; Juraschek, Dominik M.; Law, Stephanie; Narang, Prineha; Caldwell, Joshua D.

doi:10.1002/adom.202200933

Title: Mid‐ to Far‐Infrared Anisotropic Dielectric Function of HfS ₂ and HfSe ₂

Journal Article · Tue Sep 06 00:00:00 EDT 2022 · Advanced Optical Materials

DOI:https://doi.org/10.1002/adom.202200933· OSTI ID:1885873

^[1]; Nolen, Joshua Ryan ^[2]; Varnavides, Georgios ^[3];

^[4]; Allen, Jack E. ^[5]; Ciccarino, Christopher J. ^[3]; Juraschek, Dominik M. ^[6]; Law, Stephanie ^[4]; Narang, Prineha ^[3]; Caldwell, Joshua D. ^[7]

Interdisciplinary Materials Science Program Vanderbilt University Nashville TN 37212 USA
Interdisciplinary Materials Science Program Vanderbilt University Nashville TN 37212 USA, Photonics Initiative Advanced Science Research Center City University of New York New York NY 10031 USA
John A. Paulson School of Engineering and Applied Sciences Harvard University Cambridge MA 02138 USA
Department of Materials Science and Engineering University of Delaware Newark DE 19716 USA
Department of Mechanical Engineering Vanderbilt University Nashville TN 37212 USA
John A. Paulson School of Engineering and Applied Sciences Harvard University Cambridge MA 02138 USA, School of Physics and Astronomy Tel Aviv University Tel Aviv 69978 Israel
Interdisciplinary Materials Science Program Vanderbilt University Nashville TN 37212 USA, Department of Mechanical Engineering Vanderbilt University Nashville TN 37212 USA

Abstract The far‐infrared (far‐IR) remains a relatively underexplored region of the electromagnetic spectrum extending roughly from 20 to 100 µm in free‐space wavelength. Research within this range has been restricted due to a lack of optical materials that can be optimized to reduce losses and increase sensitivity, as well as by the long free‐space wavelengths associated with this spectral region. Here the exceptionally broad Reststrahlen bands of two Hf‐based transition metal dichalcogenides (TMDs) that can support surface phonon polaritons (SPhPs) within the mid‐infrared (mid‐IR) into the terahertz (THz) are reported. In this vein, the IR transmission and reflectance spectra of hafnium disulfide (HfS ₂ ) and hafnium diselenide (HfSe ₂ ) flakes are measured and their corresponding dielectric functions are extracted. These exceptionally broad Reststrahlen bands (HfS ₂ : 165 cm ⁻¹ ; HfSe ₂ : 95 cm ⁻¹ ) dramatically exceed that of the more commonly explored molybdenum‐ (Mo) and tungsten‐ (W) based TMDs (≈5–10 cm ⁻¹ ), which results from the over sevenfold increase in the Born effective charge of the Hf‐containing compounds. This work therefore identifies a class of materials for nanophotonic and sensing applications in the mid‐ to far‐IR, such as deeply sub‐diffractional hyperbolic and polaritonic optical antennas, as is predicted via electromagnetic simulations using the extracted dielectric function.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: DE‐SC0019140; DE‐AC02‐05CH11231

OSTI ID:: 1885873

Journal Information:: Advanced Optical Materials, Journal Name: Advanced Optical Materials Vol. 10 Journal Issue: 23; ISSN 2195-1071

Publisher:: Wiley Blackwell (John Wiley & Sons)Copyright Statement

Country of Publication:: Germany

Language:: English

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