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Theory of Sheaths Near Positively Biased Electrodes.

Conference · Wed Jun 01 00:00:00 EDT 2016

DOI:https://doi.org/10.1109/PLASMA.2016.7534341· OSTI ID:1884473

Scheiner, Brett Stanford; Baalrud, Scott D. ^[1]; Yee, Benjamin Tong; Hopkins, Matthew M.; Barnat, Edward V.

U. Iowa

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0003525

OSTI ID:: 1884473

Report Number(s):: SAND2016-5773C; 699012

Country of Publication:: United States

Language:: English

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