skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Wide bandgap semiconductor materials and devices

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/5.0100601· OSTI ID:1883016
ORCiD logo [1];  [2]; ORCiD logo [3]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Peking Univ., Beijing (China)
  3. Osaka Metropolitan University (Japan); National Institute of Information and Communications Technology, Tokyo (Japan)

The technological and societal impacts of electronic devices based on Ge, Si, and compound semiconductors like GaAs have been profound, fueling the decades long quest in identifying ever-larger bandgap semiconductors to untap new applications and possibilities. Specifically, an increase in the bandgap leads to shorter wavelength emission and an increased breakdown electric field, which has direct consequences for solid-state lighting like light-emitting diodes (LEDs) and laser diodes (LDs) from the visible (blue-green, blue, and violet) and beyond (UV and deep-UV) spectral range and for radically improved power devices supported by a higher intrinsic breakdown strength. Wide bandgap (WBG) semiconductors represent the frontier of materials that satisfy these criteria and include group IV, III–V, and II–VI material families like SiC (3.2 eV), GaN (3.4 eV), and ZnO (3.4 eV), respectively. With even larger bandgaps exceeding 4 eV, ultrawide bandgap (UWBG) semiconductors include diamond, III-nitrides incorporating Al and B (e.g., AlN, BN, and AlGaN), and sesquioxides like Ga2O3 and (Al,Ga)2O3. These materials span widely varying stages of technological maturity, with SiC and GaN platforms among the most mature with commercially available devices in RF and high-power electronics, while other platforms such as Ga2O3 rapidly advancing and poised to enable new UV and deep-UV optoelectronic devices. This Special Topic on Wide Bandgap Semiconductor Materials and Devices covers broad research subtopics on WBG and UWBG materials that span bulk crystals, epitaxy and substrate technologies, fundamental defect science, and doping, as well as electronic and optoelectronic device fabrication and characterization. Here, we highlight works from the collection, which we categorize by material platform of SiC, III-nitrides, and Ga2O3 and related alloys.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1883016
Report Number(s):
LLNL-JRNL-835418; 1054340; TRN: US2308148
Journal Information:
Journal of Applied Physics, Vol. 131, Issue 23; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (44)

Realization of highly rectifying Schottky barrier diodes and pn heterojunctions on κ-Ga2O3 by overcoming the conductivity anisotropy journal August 2021
Crystal orientation dependence of deep level spectra in proton irradiated bulk β-Ga2O3 journal July 2021
Forward and reverse current transport mechanisms in tungsten carbide Schottky contacts on AlGaN/GaN heterostructures journal June 2021
Rare-earth defects and defect-related luminescence in ZnS journal January 2022
Influence of the facet trace region in 4H-SiC substrate on the glide and propagation behaviors of basal plane dislocations in 4H-SiC homoepitaxial layers journal September 2021
Impact of operation parameters on the degradation of 233 nm AlGaN-based far-UVC LEDs journal January 2022
All sp2 hybridization BN polymorphs with wide bandgap journal February 2022
Multi-output deep learning model for simultaneous prediction of figure of merits (Ion, Gm, and Vth) of gallium nitride high electron mobility transistors journal February 2022
A pathway to highly conducting Ge-doped AlGaN journal November 2021
Non-monotonic threshold voltage variation in 4H-SiC metal–oxide–semiconductor field-effect transistor: Investigation and modeling journal October 2021
Growth of bulk β-Ga 2 O 3 single crystals by the Czochralski method journal January 2022
Low-temperature direct bonding of SiC and Ga2O3 substrates under atmospheric conditions journal August 2021
Electronic and ionic conductivity in β-Ga2O3 single crystals journal February 2022
Effects of high temperature annealing on the atomic layer deposited HfO2/β-Ga2O3 (010) interface journal January 2022
Layered phase composition and microstructure of κ-Ga2O3-dominant heteroepitaxial films grown via MOCVD journal February 2022
Incorporation of Si and Sn donors in β-Ga2O3 through surface reconstructions journal November 2021
Deep level study of chlorine-based dry etched β − Ga2O3 journal July 2021
In-operando x-ray topography analysis of SiC metal–oxide–semiconductor field-effect transistors to visualize stacking fault expansion motions dynamically during operations journal October 2021
Computational Fermi level engineering and doping-type conversion of Mg:Ga 2 O 3 via three-step synthesis process journal June 2021
Breakdown characteristics of deep-ultraviolet Al0.6Ga0.4N p-i-n avalanche photodiodes journal March 2022
Wurtzite ScAlN, InAlN, and GaAlN crystals, a comparison of structural, elastic, dielectric, and piezoelectric properties journal July 2021
Ultrathin atomic layer deposited niobium oxide as a passivation layer in silicon based photovoltaics journal December 2021
Epitaxial lateral overgrowth of r-plane α-Ga2O3 with stripe masks along ⟨1¯21¯0⟩ journal November 2021
Performance of metal-semiconductor field effect transistors on mist chemical-vapor-deposition grown ZnO channels with intentionally oxidized AgOx Schottky contact gates journal November 2021
Evidence of thermionic emission in forward biased β-Ga2O3 Schottky diodes at Boltzmann doping limit journal January 2022
Rationale behind subpicosecond optical response of transparent conductive oxides in epsilon-near-zero region journal June 2021
Influence from the electronic shell structure on the range distribution during channeling of 40–300 keV ions in 4H-SiC journal August 2021
Probing the surface potential of SiO2/4H-SiC(0001) by terahertz emission spectroscopy journal September 2021
Residual stress analysis of aluminum nitride piezoelectric micromachined ultrasonic transducers using Raman spectroscopy journal July 2021
On the enhancement of carrier injection efficiency by employing AlInN last quantum barrier in 277 nm ultraviolet light-emitting diodes journal June 2021
Realizing crack-free high-aluminum-mole-fraction AlGaN on patterned GaN beyond the critical layer thickness journal February 2022
From atomistic tight-binding theory to macroscale drift–diffusion: Multiscale modeling and numerical simulation of uni-polar charge transport in (In,Ga)N devices with random fluctuations journal August 2021
Adlayer control for tunable AlGaN self-assembled superlattices journal October 2021
Scaling of phonon frequencies and electron binding energies with interatomic distances in InxGa1−xN journal November 2021
High temperature characteristics of nitric oxide annealed p-channel 4H-SiC metal oxide semiconductor field effect transistors journal December 2021
Mg doping and diffusion in (010) β-Ga2O3 films grown by plasma-assisted molecular beam epitaxy journal December 2021
1 GeV proton damage in β-Ga2O3 journal November 2021
Electronic and optical properties of Zn-doped β-Ga 2 O 3 Czochralski single crystals journal June 2021
p-type AlN based heteroepitaxial diodes with Schottky, Pin, and junction barrier Schottky character achieving significant breakdown performance journal November 2021
GaN-based power devices: Physics, reliability, and perspectives journal November 2021
Impact of thermal annealing on deep levels in nitrogen-implanted β-Ga2O3 Schottky barrier diodes journal December 2021
Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors journal November 2021
Optical phonon modes, static and high-frequency dielectric constants, and effective electron mass parameter in cubic In2O3 journal June 2021
Prospects for phase engineering of semi-stable Ga2O3 semiconductor thin films using mist chemical vapor deposition journal March 2022

Similar Records

ITRW: Formulating a Roadmap for WBG and UWBG Materials and Devices
Technical Report · Sat Jun 01 00:00:00 EDT 2019 · OSTI ID:1883016

Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges
Journal Article · Mon Dec 04 00:00:00 EST 2017 · Advanced Electronic Materials · OSTI ID:1883016

Wide-Bandgap Semiconductors
Technical Report · Tue Nov 22 00:00:00 EST 2005 · OSTI ID:1883016