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Advanced magnetic X-ray spectro-microscopies to characterize mesoscopic magnetic materials

Journal Article · · Journal of Magnetism and Magnetic Materials
 [1];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Santa Cruz, CA (United States)

Here, this article provides a brief overview of advanced magnetic X-ray spectro-microscopies that are widely used in characterizing mesoscopic magnetic materials. Common to those techniques are various X-ray magnetic dichroism effects that are used as magnetic contrast mechanism. A particular interest is to use those techniques to image the underlying microscopic spin structures in magnetic materials with high spatial resolution and to ultimately resolve their full 3D mesoscale characteristics with elemental sensitivity, as well as their ultrafast dynamics upon excitations with field and current pulses. Recent research examples using various magnetic X-ray spectro-microscopies are presented to showcase their specific features with a focus on imaging novel topological spin textures, such as vortices, skyrmions and Hopfions, which are considered as potential building blocks towards low power, high-speed and high-density magnetic devices that could transform information technologies and potentially be used in biomedical applications. Future developments with magnetic X-ray spectro-microscopies harness the full coherence of next generation X-ray sources and could open the path towards single shot imaging with spatial and temporal resolutions down to fundamental magnetic length and time scales.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1882844
Alternate ID(s):
OSTI ID: 1868695
Journal Information:
Journal of Magnetism and Magnetic Materials, Journal Name: Journal of Magnetism and Magnetic Materials Vol. 545; ISSN 0304-8853
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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