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Hole in one: Pathways to deterministic single-acceptor incorporation in Si(100)-2 x 1

Journal Article · · AVS Quantum Science
DOI:https://doi.org/10.1116/5.0075467· OSTI ID:1870448
We report that stochastic incorporation kinetics can be a limiting factor in the scalability of semiconductor fabrication technologies using atomic-precision techniques. While these technologies have recently been extended from donors to acceptors, the extent to which kinetics will impact single-acceptor incorporation has yet to be assessed. To identify the precursor molecule and dosing conditions that are promising for deterministic incorporation, we develop and apply an atomistic model for the single-acceptor incorporation rates of several recently demonstrated molecules: diborane (B2H6), boron trichloride (BCl3), and aluminum trichloride in both monomer (AlCl3) and dimer forms (Al2Cl6). While all three precursors can realize single-acceptor incorporation, we predict that diborane is unlikely to realize deterministic incorporation, boron trichloride can realize deterministic incorporation with modest heating (50 °C), and aluminum trichloride can realize deterministic incorporation at room temperature. We conclude that both boron and aluminum trichloride are promising precursors for atomic-precision single-acceptor applications, with the potential to enable the reliable production of large arrays of single-atom quantum devices.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE; USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0003525
OSTI ID:
1870448
Alternate ID(s):
OSTI ID: 1847198
Report Number(s):
SAND2022-3603J; 704496
Journal Information:
AVS Quantum Science, Journal Name: AVS Quantum Science Journal Issue: 1 Vol. 4; ISSN 2639-0213
Publisher:
American Institute of Physics (AIP) - American Vacuum SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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