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First-Principles Dissociation Pathways of BCl3 on the Si(100)-2 × 1 Surface

Journal Article · · Journal of Physical Chemistry. C
BCl3 is a promising acceptor precursor for atomic-precision δ-doping of silicon, as it has been observed to rapidly dissociate into boron doped into the silicon surface and surface chlorine, which can be removed upon annealing. The chemical pathway and the resulting kinetics, through which BCl3 adsorbs and dissociates on silicon, however, have only been partially explained. Here, in this work, we use density functional theory to expand the dissociation reactions of BCl3 to include reactions that take place across multiple silicon dimer rows and reactions which end in a bare B atom either at the surface, substituted for a surface silicon, or in a subsurface position. We further simulate the resulting scanning tunneling microscopy images for each of these BClx dissociation fragments, demonstrating that they often display distinct features that may allow for relatively confident experimental identification. Finally, we input the full dissociation pathway for BCl3 into a kinetic Monte Carlo model, which simulates realistic reaction pathways as a function of environmental conditions, such as the pressure and temperature of dosing. We find that BCl2 is broadly dominant at low temperatures, while high temperatures and ample space on the silicon surface for dissociation encourage the formation of bridging BCl fragments and B substitutions on the surface. This work provides the chemical mechanisms for understanding atomic-precision doping of Si with B, enabling a number of relevant quantum applications, such as bipolar nanoelectronics, acceptor-based qubits, and superconducting Si.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
NA0003525
Other Award/Contract Number:
229375
OSTI ID:
3018790
Report Number(s):
SAND--2026-15919J; 1776795
Journal Information:
Journal of Physical Chemistry. C, Journal Name: Journal of Physical Chemistry. C Journal Issue: 50 Vol. 129; ISSN 1932-7455; ISSN 1932-7447
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

References (41)

Single‐Atom Control of Arsenic Incorporation in Silicon for High‐Yield Artificial Lattice Fabrication journal March 2024
Realization of Atomically Controlled Dopant Devices in Silicon journal April 2007
A new algorithm for Monte Carlo simulation of Ising spin systems journal January 1975
A general method for numerically simulating the stochastic time evolution of coupled chemical reactions journal December 1976
Reaction of BCl3 with H- and Cl-terminated Si(1 0 0) as a pathway for selective, monolayer doping through wet chemistry journal December 2020
KMCLib: A general framework for lattice kinetic Monte Carlo (KMC) simulations journal September 2014
The PseudoDojo: Training and grading a 85 element optimized norm-conserving pseudopotential table journal May 2018
A Model for Atomic Precision p-Type Doping with Diborane on Si(100)-2×1 journal January 2021
AlCl 3 -Dosed Si(100)-2 × 1: Adsorbates, Chlorinated Al Chains, and Incorporated Al journal May 2021
Effects of Strain on Diborane Dissociative Adsorption and Boron Incorporation on Si0.5Ge0.5(001)-2 × 1 Surfaces journal July 2024
B-Doped δ-Layers and Nanowires from Area-Selective Deposition of BCl 3 on Si(100) journal August 2021
Enhanced Atomic Precision Fabrication by Adsorption of Phosphine into Engineered Dangling Bonds on H–Si Using STM and DFT journal November 2022
Suppressing Segregation in Highly Phosphorus Doped Silicon Monolayers journal October 2015
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy journal March 2020
What Do the Kohn−Sham Orbitals and Eigenvalues Mean? journal April 1999
Bottom-up superconducting and Josephson junction devices inside a group-IV semiconductor journal July 2014
A single-atom transistor journal February 2012
Experimental realization of an extended Fermi-Hubbard model using a 2D lattice of dopant-based quantum dots journal November 2022
EUV-induced hydrogen desorption as a step towards large-scale silicon quantum device patterning journal January 2024
Bipolar device fabrication using a scanning tunnelling microscope journal July 2020
The butterfly – a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations journal January 2016
Reaction paths of phosphine dissociation on silicon (001) journal January 2016
Direct integration of atomic precision advanced manufacturing into middle-of-line silicon fabrication journal October 2025
QUANTUM ESPRESSO: a modular and open-source software project for quantum simulations of materials journal September 2009
Theory of two boron neutral pair defects in silicon journal June 1992
Al-alkyls as acceptor dopant precursors for atomic-scale devices journal September 2021
Roadmap on atomic-scale semiconductor devices journal March 2025
Impact of Incorporation Kinetics on Device Fabrication with Atomic Precision journal November 2021
Special points for Brillouin-zone integrations journal June 1976
Theory of the scanning tunneling microscope journal January 1985
Theoretical study of the Si(100) surface reconstruction journal May 1995
Atomic structures of boron-induced protrusion features on Si(100) surfaces journal January 2008
Spin-Lattice Relaxation Times of Single Donors and Donor Clusters in Silicon journal December 2014
Generalized Gradient Approximation Made Simple journal October 1996
Atomically Precise Placement of Single Dopants in Si journal September 2003
Hole in one: Pathways to deterministic single-acceptor incorporation in Si(100)-2 × 1 journal March 2022
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques journal January 2021
Atomically engineered electron spin lifetimes of 30 s in silicon journal March 2017
Über die Reaktionsgeschwindigkeit bei der Inversion von Rohrzucker durch Säuren journal January 1889
Atomic-precision advanced manufacturing for Si quantum computing journal July 2021
Atomic Precision Advanced Manufacturing for Digital Electronics journal February 2020

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