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Vibrational Sum-Frequency Generation Hyperspectral Microscopy for Molecular Self-Assembled Systems

Journal Article · · Annual Review of Physical Chemistry
 [1];  [2]
  1. Department of Chemistry and Biochemistry, University of California, San Diego, La Jolla, California 92093, USA,,; OSTI
  2. Department of Chemistry and Biochemistry, University of California, San Diego, La Jolla, California 92093, USA,,; Materials Science and Engineering Program, University of California, San Diego, La Jolla, California 92093, USA

In this review, we discuss the recent developments and applications of vibrational sum-frequency generation (VSFG) microscopy. This hyperspectral imaging technique can resolve systems without inversion symmetry, such as surfaces, interfaces and noncentrosymmetric self-assembled materials, in the spatial, temporal, and spectral domains. We discuss two common VSFG microscopy geometries: wide-field and confocal point-scanning. We then introduce the principle of VSFG and the relationships between hyperspectral imaging with traditional spectroscopy, microscopy, and time-resolved measurements. We further highlight crucial applications of VSFG microscopy in self-assembled monolayers, cellulose in plants, collagen fibers, and lattice self-assembled biomimetic materials. In these systems, VSFG microscopy reveals relationships between physical properties that would otherwise be hidden without being spectrally, spatially, and temporally resolved. Lastly, we discuss the recent development of ultrafast transient VSFG microscopy, which can spatially measure the ultrafast vibrational dynamics of self-assembled materials. The review ends with an outlook on the technical challenges of and scientific potential for VSFG microscopy.

Research Organization:
Univ. of California, San Diego, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0019333
OSTI ID:
1853097
Journal Information:
Annual Review of Physical Chemistry, Journal Name: Annual Review of Physical Chemistry Journal Issue: 1 Vol. 72; ISSN 0066-426X
Publisher:
Annual Reviews
Country of Publication:
United States
Language:
English

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