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Characterizing x-ray transmission through filters used in high energy density physics diagnostics

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0043770· OSTI ID:1850396
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  1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States). Plasma Science and Fusion Center; Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  2. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States). Plasma Science and Fusion Center
We report on the design and implementation of a new system used to characterize the energy-dependent x-ray transmission curve, Θ(E), through filters used in high-energy density physics diagnostics. Using an Amptek X-123-CdTe x-ray spectrometer together with a partially depleted silicon surface barrier detector, both the energy spectrum and total emission of an x-ray source have been accurately measured. By coupling these detectors with a custom PROTO-XRD x-ray source with interchangeable cathodes, accurate characterizations of Θ(E) for filters of varying materials and thicknesses have been obtained. The validity of the technique has been confirmed by accurately reproducing areal densities for high-purity filters with known x-ray transmission properties. In this paper, the experimental setup is described and the results of absorption calibrations performed on a variety of different filters are presented.
Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0003868
OSTI ID:
1850396
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 92; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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