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Chalcogenide perovskite BaZrS3 thin-film electronic and optoelectronic devices by low temperature processing

Journal Article · · Nano Energy
 [1];  [2];  [3];  [2];  [2];  [3];  [3];  [4];  [3];  [5];  [6];  [2]
  1. Xi'an Jiaotong Univ., Shaanxi (China). MOE Key Lab. for Nonequilibrium Synthesis and Modulation of Condensed Matter; Univ. at Buffalo, NY (United States)
  2. Univ. at Buffalo, NY (United States). Dept. of Physics
  3. Univ. at Buffalo, NY (United States). Dept. of Materials Design and Innovation
  4. Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Ceramics, Key Lab. of High Performance Ceramics and Superfine Microstructure
  5. Rensselaer Polytechnic Inst., Troy, NY (United States). Dept. of Physics, Applied Physics & Astronomy
  6. Xi'an Jiaotong Univ., Shaanxi (China). MOE Key Lab. for Nonequilibrium Synthesis and Modulation of Condensed Matter
Owing to its superior visible light absorption and high chemical stability, chalcogenide perovskite barium zirconium sulfide (BaZrS3) has attracted significant attention in the past few years as a potential alternative to hybrid halide perovskites for optoelectronics. However, the high processing temperatures of BaZrS3 thin films at above 1000 °C severely limits their potential for device applications. Herein, we report the synthesis of BaZrS3 thin films at temperatures as low as 500 °C, by changing the chemical reaction pathway. The single phase BaZrS3 thin film was confirmed by X-ray diffraction and Raman spectroscopy. Atomic force microscopy and scanning electron microscopy show that crystalline size and surface roughness were consistently reduced with decreasing annealing temperature. The lower temperatures further eliminate sulfur vacancies and carbon contaminations associated with high temperature processing. The ability to synthesize chalcogenide perovskite thin films at lower temperatures removes a major hurdle for their device fabrication. The photodetectors demonstrate fast response and an on/off ratio of 80. Finally, the fabricated field effect transistors show an ambipolar behavior with electron and hole mobilities of 16.8 cm2/Vs and 2.6 cm2/Vs, respectively.
Research Organization:
State Univ. of New York (SUNY), Albany, NY (United States)
Sponsoring Organization:
National Science Foundation (NSF); National Science Foundation of China (NSFC); USDOE; USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Grant/Contract Number:
EE0007364
OSTI ID:
1848516
Alternate ID(s):
OSTI ID: 1782384
Journal Information:
Nano Energy, Journal Name: Nano Energy Journal Issue: C Vol. 85; ISSN 2211-2855
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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