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Title: Scanning structural mapping at the Life Science X-ray Scattering Beamline

Journal Article · · Journal of Synchrotron Radiation (Online)

This work describes the instrumentation and software for microbeam scattering and structural mapping at the Life Science X-ray Scattering (LiX) beamline at NSLS-II. Using a two-stage focusing scheme, an adjustable beam size between a few micrometres and a fraction of a millimetre is produced at the sample position. Scattering data at small and wide angles are collected simultaneously on multiple Pilatus detectors. A recent addition of an in-vacuum Pilatus 900k detector, with the detector modules arranged in a C-shaped configuration, has improved the azimuthal angle coverage in the wide-angle data. As an option, fluorescence data can be collected simultaneously. Fly scans have been implemented to minimize the time interval between scattering patterns and to avoid unnecessary radiation damage to the sample. For weakly scattering samples, an in-vacuum sample environment has been developed here to minimize background scattering. Data processing for these measurements is highly sample-specific. To establish a generalized data process workflow, first the data are reduced to reciprocal coordinates at the time of data collection. The users can then quantify features of their choosing from these intermediate data and construct structural maps. As examples, results from in-vacuum mapping of onion epidermal cell walls and 2D tomographic sectioning of an intact poplar stem are presented.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Institutes of Health (NIH); National Institute of General Medical Sciences (NIGMS); USDOE Office of Science (SC), Biological and Environmental Research (BER)
Grant/Contract Number:
KP1605010; SC0012704; P30GM133893; S10 OD012331
OSTI ID:
1840613
Alternate ID(s):
OSTI ID: 1844570
Report Number(s):
BNL-222733-2022-JAAM; JSYRES; PII: S1600577521013266
Journal Information:
Journal of Synchrotron Radiation (Online), Journal Name: Journal of Synchrotron Radiation (Online) Vol. 29 Journal Issue: 2; ISSN 1600-5775
Publisher:
International Union of Crystallography (IUCr)Copyright Statement
Country of Publication:
Denmark
Language:
English

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