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In-pixel automatic threshold calibration for the CMS Endcap Timing Layer readout chip

Journal Article · · Journal of Instrumentation
 [1];  [2];  [3];  [4];  [1];  [2];  [2];  [3];  [3];  [3];  [3];  [2];  [1];  [1]
  1. Central China Normal University, Wuhan, Hubei (China); Southern Methodist Univ., Dallas, TX (United States)
  2. Southern Methodist Univ., Dallas, TX (United States)
  3. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
  4. Central China Normal University, Wuhan, Hubei (China)
+ Show Author Affiliations
We present the implementation and verification of an in-pixel automatic threshold calibration circuit for the CMS Endcap Timing Layer (ETL) in the High-Luminosity LHC upgrade. The discriminator threshold of the ETL readout chip (ETROC) needs to be calibrated regularly to mitigate the circuit baseline change. Traditional methods need a lot of communication through a slow control system hence are time-consuming. This paper describes an in-pixel automatic scheme with improvements in operating time and usability. In this scheme, a sample-accumulation circuit is used to measure the average discriminator output. A binary successive approximation and linear combination scan are applied to find the equivalent baseline. The actual calibration procedure has been first implemented in FPGA firmware and tested with the ETROC front-end prototype chip (ETROC0). The calibration circuit has been implemented with Triple Modular Redundancy (TMR) and verified with Single Event Effects (SEEs) simulation. A complete calibration process lasts 35 ms with a 40 MHz clock. In the worst case, the dynamic and static power consumption are estimated to be 300 uW and 10.4 uW, respectively. The circuit design, implemented in a 65 CMOS technology, will be integrated into ETROC2, the next iteration of the ETROC with a 16 x16 pixel matrix.
Research Organization:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
Grant/Contract Number:
AC02-07CH11359
OSTI ID:
1831842
Alternate ID(s):
OSTI ID: 23165371
Report Number(s):
FERMILAB-PUB--21-395-PPD; arXiv:2109.01296; oai:inspirehep.net:1916118
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 09 Vol. 16; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

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